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EBSD and BKD    

 

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Articles in Journals

 

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A1

K.H. Gaukler and R. Schwarzer

Verbessertes Verfahren zur Bestimmung des mittleren inneren Potentials aus Refle­xions-Kikuchi-Diagrammen.

Optik 33 (1971) 215-229

424

A2

K.H. Gaukler and R. Schwarzer

Elektronen-Emissions-Mikroskopie (Review article).

Messtechnik 81 (1973) 307-316

1.190

A3

J. Hofmeister and R. Schwarzer

Zum Einfluß der kristallographischen Orientierung auf den vektoriellen Photoeffekt.­­

Physics Letters 53A (1975) 283-284

501

A4

G.H. Hartmann, H.P. Niemitz, and R.A. Schwarzer

Bestimmung des mittleren inneren Potentials von Diamant und von Vanadium-Pentoxid aus Reflexions-Kikuchi-Diagrammen.

Optik 44 (1975) 37-43

488

A5

R. Schwarzer

Der Einfluß von Loch- und Ringblenden auf die Energieverteilung der Elektronen im Emissions-Elektronenmikroskop.

Optik 44 (1975) 61-78

1.078

A6

R. Schwarzer

Die Verbesserung des Bildkontrastes im Emissions-Elektronenmikroskop durch eine ringförmige Aperturblende.

Optik 44 (1975) 121-131

533

A7

 

M.B. Trullenque, Z.P. Argüello, and R.A. Schwarzer

Investigations of ionic crystals with the photoemission electron microscope.

Revista Microscopia Electrónica 3 (1976) 156-157

252

 

A7a

R.A. Schwarzer, J.I. Cisneros, M. Tomyiama, Shih-Lin Chang, and Z.P. Argüello

Study of Orientation Contrast and Information Depth in LiF with the Photoemission Electron Microscope (PEEM).

Revista de Microscopía Electrónica 5 (1978)

288

A8

W. May, E.A. Farah, and R. Schwarzer

EMA and PEEM studies of WC-Ti interface reactions.

Revista Microscopia Electrónica 3 (1976) 190-191

390

A9

R. Schwarzer and K.H. Gaukler

Erzeugung einer Ionen-Mikrosonde mittels Feldionisation und Emissionslinse.

Vakuum-Technik 27 (1978) 2-5

81

A10

R. Schwarzer

Die Bestimmung von Strukturpotentialen aus Kossel-Möllenstedt-Diagrammen an epitaktisch aufgedampften, freitragenden Kupfereinkristallschichten.

Optik 54 (1979) 193-199

190

A12

R.A. Schwarzer

Bestimmung von Polfiguren und Texturanalyse mit dem Transmissions-Elektro­nen­mikroskop.

Z. Metallkunde 73 (1982) 495-498

507

A13

R.A. Schwarzer

On-line measurement of foil thickness from Kossel-Möllenstedt diffraction patterns.

Optik 77 (1987) 55-56

179

A14

R.A. Schwarzer and H. Weiland

Texture analysis by the measurement of individual grain orientations - Electron microscopical methods and application on dual-phase steel.

Textures and Microstructures 8&9 (1988) 551-577

1.459

A15

R.A. Schwarzer
Measurement of local textures with transmission and scanning electron microscopes.

Textures and Microstructures 13 (1990) 15-30

1.502

A16

R. Schwarzer
Die Kristalltextur in der Mikroelektronik.
Teil 1. Elektronenmikroskopische Meßverfahren.
Verbindungstechnik in der Elektronik 3 (1991) Heft 1, 16-20
Teil 2. Hügelbildung in dünnen Metallisierungsschichten.
Verbindungstechnik in der Elektronik 3 (1991) Heft 2, 56-59

1.419

A17

R.A. Schwarzer
A review of the analysis of local texture by electron diffraction.
Textures and Microstructures 14-18 (1991) 85-90

799

A18

R.A. Schwarzer
Scanning X-ray apparatus for texture mapping by energy dispersive diffraction.
Textures and Microstructures 14-18 (1991) 241-244

478

A19

R.A. Schwarzer

Texture analysis by electron diffraction.

Steel research 62 (1991) 542-547

1.079

A20

D. Gerth, D. Katzer, and R. Schwarzer

Correlation between grain growth and hillock growth in thin thermally annealed Al-1%Si films on silicon substrates.

Materials Science Forum 94-96 (1992) 557-562 / Proc. Intern. Conf. on Grain Growth in Poly­crystalline Materials, Rome 1991

273

A21

D. Gerth and R.A. Schwarzer

The development of grain-specific texture and grain boundary character during grain growth of Al-1%Si films on SiO2/Si substrates.

Materials Science Forum 113-115 (1993) 619-624 / Proc. Intern. Conf. on Recrystallization and Related Phenomena (Recrystallization '92), San Sebastian 1992

126

A22

D. Gerth and R.A. Schwarzer

The effect of grain-specific texture on hillock growth in Al-1%Si films on SiO2/Si substrates.

Materials Science Forum 113-115 (1993) 625-630 / Proc. Intern. Conf. on Recrystallization and Related Phenomena (Recrystal­lization­­­­­­ '92), San Sebastian 1992

246

A23

S. Zaefferer and R.A. Schwarzer

Microstructure and local texture of partially recrystallized titanium sheet.

Materials Science Forum 113-115 (1993) 721-724 / Proc. Intern. Conf. on Recrystallization and Related Phenomena (Recrystallization '92), San Sebastian 1992

114

A24

R.A. Schwarzer

Crystal texture analysis of ceramics by electron microscopy.

Ceramika 42 (1993) 59-65 / Polski Biuletyn Ceramiczny 4 (1993)

100

A25

R.A. Schwarzer

The determination of local texture by electron diffraction - A tutorial review.

Textures and Microstructures 20 (1993) 7-27

3.495

A26

D. Gerth and R.A. Schwarzer

Graphical representation of grain and hillock orientations in annealed Al-1%Si films.

Textures and Microstructures 21 (1993) 177-193

774

A27

R.A. Schwarzer and D. Gerth

The effect of grain orientation on the relaxation of thermomechanical stress in Al-1%Si conductor layers on SiO2/Si substrates.  

Journal of Electronic Materials 22 (1993) 607-610  https://doi.org/10.1007/BF02666405

1.039

A28

R.A. Schwarzer

Texture distributions imaged by energy dispersive x-ray diffraction.

Steel Research 64 (1993) 570-574

1.157

A29

R.A. Schwarzer

A CCD camera system for the acquisition of backscatter Kikuchi patterns on an SEM.

Materials Science Forum 157-162 (1994) 187-188 / Proc. ICOTOM 10, Clausthal 1993

100

A30

R.A. Schwarzer and S. Zaefferer

An inexpensive CCD camera system for recording and on-line interpretation of TEM Kikuchi patterns.

Materials Science Forum 157-162 (1994) 189-194 / Proc. ICOTOM 10, Clausthal 1993

312

A31

R.A. Schwarzer and S. Zaefferer

On-line interpretation of SAD channeling patterns.

Materials Science Forum 157-162 (1994) 195-200 / Proc. ICOTOM 10, Clausthal, 1993

176

A32

R.A. Schwarzer

Preparation of high-resistance or sensitive samples for grain orientation measurements with electron microscopes.

Materials Science Forum 157-162 (1994) 201-206 / Proc. ICOTOM 10, Clausthal 1993

272

A33

S. Zaefferer and R.A. Schwarzer

On-line determination of complete deformation systems for cubic and hexagonal crys­­tals in the TEM.

Materials Science Forum 157-162 (1994) 241-246 / Proc. ICOTOM 10, Clausthal 1993

383

A34

S. Zaefferer and R.A. Schwarzer

On-line interpretation of spot and Kikuchi patterns.

Materials Science Forum 157-162 (1994) 247-250 / Proc. ICOTOM 10, Clausthal 1993

188

A35

W. Xia and R.A. Schwarzer

PC program for the calculation of ODF from SAD pole figures or from individual grain orientations.

Materials Science Forum 157-162 (1994) 487-492 / Proc. ICOTOM 10, Clausthal 1993

300

A36

M. Barthel, D. Gerth, R.A. Schwarzer, P. Klimanek, and U. Messerschmidt

Individual grain orientation relations after high-speed hot rolling of steel rods.

Materials Science Forum 157-162 (1994) 1131-1136 / Proc. ICOTOM 10, Clausthal 1993

479

A37

D. Gerth, S. Zaefferer, and R.A. Schwarzer

Stress-induced grain growth in thin Al-1% Si films on SiO2/Si substrates.

Materials Science Forum 157-162 (1994) 1205-1210 / Proc. ICOTOM 10, Clausthal 1993

1.304

A38

K. Helming and R.A. Schwarzer

Texture estimate from minimum ranges of SAD pole figures.

Materials Science Forum 157-162 (1994) 1219-1224 / Proc. ICOTOM 10, Clausthal 1993

264

A39

S. Zaefferer, D. Gerth, and R.A. Schwarzer

Determination of local texture and deformation systems in TiAl6V4 and T40.

Materials Science Forum 157-162 (1994) 1319-1324 / Proc. ICOTOM 10, Clausthal 1993

523

A40

D. Gerth and R.A. Schwarzer

Local mechanical properties in thin Al layers on Si substrates calculated from measured grain orientations.

Materials Science Forum 157-162 (1994) 1571-1576 / Proc. ICOTOM 10, Clausthal 1993

240

A41

K. Helming, R.A. Schwarzer, B. Rauschenbach, S. Geier, B. Leiss, H.-R. Wenk, K. Ullemeyer, and J. Heinitz

Texture estimates by means of components.

Z. Metallkunde 85 (1994) 545-553

1.627

A42

M. Wehrhahn and R.A. Schwarzer

Crystal texture mapping by energy dispersive x-ray diffraction.

Z. Metallkunde 85 (1994) 581-584

321

A43

S. Zaefferer and R.A. Schwarzer

Automated measurement of single grain orientations in the TEM.

Z. Metallkunde 85 (1994) 585-591

403

A44

D. Gerth, D. Katzer, and R.A. Schwarzer

The influence of local thermomechanical stress on grain growth in thin Al-1%Si layers on SiO2/Si substrates.

Physica status solidi (a) 146 (1994) 299-316

1.360

A45

R.A. Schwarzer and S. Zaefferer

Automated measurement of grain orientations and on-line determination of complete deformation systems with a TEM.

Advances in X-Ray Analysis 38 (1995) 377-381

 

235

A46

R.A. Schwarzer and M. Wehrhahn

Scanning x-ray apparatus for crystal texture mapping and micro-fluorescence analysis.

Advances in X-Ray Analysis 38 (1995) 383-385

115

A47

R.A. Schwarzer, S. Zaefferer, and K. Kunze

The characterization of microtexture by orientation mapping.

Advances in X-Ray Analysis 38 (1995) 547-550

144

A48

K. Helming, B. Rauschenbach, and R.A. Schwarzer

Analysis of crystallographic texture in small sample areas.

Textures and Microstructures 26-27 (1996) 111-124

899

A49

R.A. Schwarzer

The study of crystal texture by electron diffraction on a grain-specific scale.

Microscopy and Analysis 45 (1997) 35-37

1.574

A50

R.A. Schwarzer and M. Wehrhahn

X-ray scanning apparatus for mapping texture and element distributions.

Textures and Microstructures 29 (1997) 65-76

918

A51

R.A. Schwarzer

Advances in crystal orientation mapping with SEM and TEM.

Ultramicroscopy 67 (1997) 19-24

444

A52

R.A. Schwarzer

Review Paper: Automated crystal lattice orientation mapping using a computer-controlled SEM.

Micron 28 (1997) 249-265

702

1.585

A53

R.A. Schwarzer and J. Sukkau

Automated crystal orientation mapping (ACOM) with a computer-controlled TEM by interpreting transmission Kikuchi patterns.

Materials Science Forum 273-275 (1998) 215-222

702

A54

B. Schäfer and R.A. Schwarzer

SAD pole figures in transmission and reflection using a high-grade CCD camera as an area detector.    

Materials Science Forum 273-275 (1998) 223-228

137

A55

A.H. Fischer and R.A. Schwarzer

X-ray pole figure measurement and texture mapping of selected areas using an x-ray scanning apparatus.

Materials Science Forum 273-275 (1998) 255-262

547

A56

A.H. Fischer, D. Weirauch, and R.A. Schwarzer

Peltier-cooled solid state drift-chamber detector for energy dispersive x-ray pole-figure measurement and texture mapping.

Materials Science Forum 273-275 (1998) 263-269

670

A57

A. Huot, R.A. Schwarzer, and J.H. Driver

Texture of shear bands in Al-Mg3% (AA5182) measured by BKD.

Materials Science Forum 273-275 (1998) 319-326

493

A58

A. Ziegenbein, H. Neuhäuser, J. Thesing, R. Ritter, H. Wittich, E. Steck, F. Springer, and R.A. Schwarzer

Investigations on local plasticity of CuAl polycrystals by in-situ observations and FEM simulations.

Materials Science Forum 273-275 (1998) 363-368

264

A59

M. Lepper, A. von Glasow, D. Piscevic, and R.A. Schwarzer

Crystal texture and electromigration damage in Al-based interconnect lines studied by ACOM with the SEM.

Materials Science Forum 273-275 (1998) 573-577

193

A60

A.H. Fischer and R.A. Schwarzer

Mapping of local residual strain with an x-ray scanning apparatus.

Materials Science Forum 273-275 (1998) 673-677

128

A61

R.A. Schwarzer

Local crystal textures: experimental techniques and future trends.

Fresenius J. Anal. Chem. 361 (1998) 522-526

451

A62

R.A. Schwarzer

Crystallography and microstructure of thin films studied by X-ray and electron diffraction.

Materials Science Forum 287-288 (1998) 23-60

Proc. 6th Intern. Symposium on Trends and New Applications of Thin Films, Regensburg 18 - 20 March 1998

 

911

A63

R.A. Schwarzer

Automated crystal orientation mapping (ACOM) - a new perspective on the characterization of microstructure.

Bulletin Czech and Slovak Crystallographic Association 5 (1998) 35-36 (Special Issue A - ECM-18)

89

A64

H.J. Bunge and R.A. Schwarzer

Orientierungsstereologie - ein neuer Zweig der Texturforschung.

TU Contact 2 (1998) 67-73

2.093

A65

S. Kittelberger, U. Bolz, R.P. Huebener, B. Holzapfel, L. Mex, and R.A. Schwarzer

Transient local resistivity maximum during temperature dependent oxygen diffusion in YBa2Cu3O7-d thin films.

Physica C 312 (1999) 7-20

2.887

A66

R. Schwarzer and A.H. Fischer

Ortsaufgelöste Textur- und Gitterdehnungsanalyse mit einer Röntgenrasterapparatur.

TU Contact 5 (1999) 49-53

1.682

A67

R.A. Schwarzer and A. Huot

The study of microstructure on a mesoscale by ACOM.

Crystal Research and Technology 35 (2000) 851-862

208

A68

A.K. Singh and R.A. Schwarzer

Texture and anisotropy of mechanical properties in Titanium and its alloys.

Z. Metallkunde 91 (2000) 702-716

8.469

A69

R.A. Schwarzer, A.K. Singh, and J. Sukkau

Discrimination and mapping of phase distributions by ACOM.

Materials Science and Technology 16 (2000) 1389-1392

1.657

A70

R.A. Schwarzer

Measurement of macro-texture by ACOM - an alternative to XRD.

Materials Science and Technology 16 (2000) 1384-1388

1.556

A71

H.J. Bunge and R.A. Schwarzer

Orientation stereology - a new branch in texture research.

Advanced Engineering Materials 3 (2001) 25-39

669

A72

A.K. Singh and R.A. Schwarzer

Effect of mode of deformation by rolling on the development of texture in binary Ti-Mn alloys.

Scripta Materialia 44 (2001) 375-380

606

A73

A.K. Singh and R.A. Schwarzer

Texture of hot rolled and annealed binary Ti-Mn alloys.

Z. Metallkunde 92 (2001) 184-190

3.929

A74

A.K. Singh and R.A. Schwarzer

Evolution of cold rolling texture in the binary alloys Ti-0.4Mn and Ti-1.8 Mn.

Materials Science and Engineering A307 (2001) 151-157

349

A75

R.A. Schwarzer

EBSD studies of interconnect lines.

Revue de Métallurgie - SF2M - JA2001 (2001) 65

181

A76

R.A. Schwarzer

Phase discrimination by automated BKD.

Analytical and Bioanalytical Chemistry (ABC) 374 (2002) 699-702

301

A77

R.A. Schwarzer and J. Sukkau

Automated evaluation of Kikuchi Patterns by means of Radon and Fast Fourier Transformations, and verification by an Artificial Neural Network.

Advanced Engineering Materials 5 (2003) 601-606

268

A78

I.V. Gervas’eva, B.K. Sokolov, R.A. Schwarzer, V.V. Gubernatorov, and Ya.V. Podkin

Effect of the initial grain size on the structural inhomogeneity and texture formation upon cold rolling and annealing of the Fe-3% Si alloy.

The Physics of Metals and Metallography 96 Suppl. 1 (2003) S43-S52

1.044

A79

R.A. Schwarzer

Automated grain orientation measurement by backscatter Kikuchi diffraction.
The Physics of Metals and Metallography 96 Suppl. 1 (2003) S104-S115

811

A80

J. Pospiech, M. Ostafin, and R.A. Schwarzer

Microstructural aspects of crossrolling of copper.

Inzynieria Matrialowa 24 (2003) 802-805

373

A81

Z. Jasieński, J. Pospiech, R. Schwarzer, A. Piątkowski, and A. Litwora

Inhomogeneity of deformation induced by the change of deformation path in channel-die compressed (112)[11-1] copper single crystals.

Inzynieria Matrialowa 25 (2004) 359-363

513

A82

Z. Jasieński, J. Pospiech, A. Piątkowski, R. Schwarzer, A. Litwora, and M. Ostafin

Textural and structural effects of the change of deformation path in copper single crystals in a channel-die test.

Archives of Metallurgy and Materials 49 (2004) 11-28

962

A83

R.A. Schwarzer

Texture in hot extruded, hot rolled and laser welded magnesium base alloys.

Solid State Phenomena 105 (2005) 23-28

310

A84

M. Ostafin, J. Pospiech, and R.A. Schwarzer

Microstructure and texture in copper sheets after reverse and cross rolling.

Solid State Phenomena 105 (2005) 309-314

404

 A85

 J. Pospiech, Z. Jasienski, M. Ostafin, and R.A. Schwarzer
 Local and global effects in texture and microstructure observed after channel-  die compression of copper single crystals and after cross-rolling of copper sheets.

Solid State Phenomena 105 (2005) 321-326

252

A86

R.A. Schwarzer

Deformation textures of fcc metals subjected to frictional and abrasive wear.

Solid State Phenomena 105 (2005) 195-200

119

A87

A.K. Singh and R.A. Schwarzer

Evolution of texture in pure magnesium during rolling.

Z. Metallkunde 96 (2005) 345- 351

492

A88

R.A. Schwarzer

Advances in the analysis of texture and microstructure.

Archives of Metallurgy and Materials 50 (2005) 7-20

278

A89

M. Ostafin, J. Pospiech and R.A. Schwarzer

The evolution of deformation texture in copper by unidirectional and by cross rolling.

Archives of Metallurgy and Materials 50 (2005) 403-409

107

A90

R.A. Schwarzer

Local texture and back-end defect in hot extruded AZ91 magnesium alloy.

Z. Metallkunde 96 (2005) 1005-1008

260

A91

R.A. Schwarzer

Automated crystal orientation measurement by backscatter Kikuchi diffraction.

Z. Kristallographie Suppl. 23 (2006) 163-168

108

A92

J. Pospiech, M. Ostafin and R. Schwarzer

The effect of the rolling geometry on the texture and microstructure in AZ31 and copper.

Archives of Metallurgy and Materials 51 (2006) 37-42

483

A93

A.K. Singh and R.A. Schwarzer

Development of cold rolling texture in the binary Ti-0.4Mn alloy.

Metals Materials and Processes 18 (2006) 351-360

578

A94

B.K. Sokolov, I.V. Gervas’eva, D.P. Rodionov, R.A. Schwarzer, and Ya.V. Podkin

Effect of deformation inhomogeneities on the formation of texture during cold rolling and annealing of nickel single crystals.

The Physics of Metals and Metallography 102 (2006) 439-451

517

A95

R.A. Schwarzer

The preparation of Mg, Cd and Zn samples for crystal orientation mapping with BKD in an SEM.

Microscopy Today 15/March (2007) 40, 42

368

A96

H.-G. Brokmeier, S. Lenser, R. Schwarzer, V. Ventzke, S. Riekehr, M. Kocak, and J. Homeyer

Crystallographic texture of dissimilar laser welded Al5083-Al6013 sheets.

Materials Science Forum 539-543 (2007) 3894-3899

1.767

A97

A.K. Singh and R.A. Schwarzer

Evolution of texture during thermomechanical processing of titanium and its alloys.

Trans. Indian Institute of Metals 61 (2008) 371-387

621

A98

R.A. Schwarzer

Spatial resolution in ACOM – What will come after EBSD.

Microscopy Today 16/January (2008)

196

A99

R.A. Schwarzer

A fast ACOM/EBSD system.

Archives of Metallurgy and Materials  53 (2008) 5-10             

155

A100

 R.A. Schwarzer and J. Hjelen
 
High-speed orientation microscopy with offline solving sequences of EBSD patterns.
 
Solid State Phenomena 160 (2010) pp 295-300

116

A101

 R.A. Schwarzer
 
Orientation microscopy with Fast EBSD
 
Materials Science and Technology  26 (2010) 646-649

107

A102

J. Sukkau and R.A. Schwarzer

Reconstruction of Kikuchi patterns by intensity-enhanced Radon transformation.

Pattern Recognition Letters 33 (2012) 739–743

390

A103

Robert A. Schwarzer and Johann Sukkau
Electron Back Scattered Diffraction: Current state, prospects and comparison with X-ray diffraction texture measurement.
The Banaras Metallurgist 18 (2013) 1-11

219

A104

R. Schwarzer
Orientation microscopy using the analytical scanning electron microscope.

Pract. Metallogr. 51 (2014) 160-179

422

 

A105

R.A. Schwarzer and Jarle Hjelen
Backscattered Electron Imaging with an EBSD Detector.
Microscopy Today 23 (2015) 12-17

2.062

A106

R. Schwarzer and C. Esling
Texture et anisotropie des matériaux polycristallins - Cartographie par diffraction de Kikuchi.
Techniques de l'ingénieur - Mise en forme des métaux et fonderie: M3040 V2 (2021) 1-16 & DOC M3040 V2 (2021) 1-3        DOI  10.51257/a-v2-m3040
R. Schwarzer and C. Esling

Kikuchi diffraction patterns and orientation microscopy.
 2024 English web version of M3040    DOI  10.51257/a-v2-m3040

2.163

A107

C. Esling and R. Schwarzer

Texture et anisotropie des matériaux polycrystallins - Diffraction RX, rayonnement synchrotron et neutrons.

Techniques de l'Ingénieur - Mise en forme des métaux et fonderie: M3039 v1 (2022) 1-32 & DOC M3039 v1 (2022) 1-3        

DOI  10.51257/a-v1-m3039

C. Esling and R. Schwarzer

X-ray diffraction, synchrotron radiation and neutrons

2025 English web version of M3039    DOI  10.51257/a-v1-m3039

 

(preprint)

(5984)

 

 

 

 

Conference Proceedings

 

 

 

 

C1

R. Schwarzer, W. Leiser, and K.H. Gaukler

Untersuchungen mit dem Photoemissions-Elektronenmikroskop (PhEEM).

BEDO (= Beiträge zur elektronenmikroskop. Direktabbildung von Oberflächen) 5 (1972) 977-986

400

C2

G. Möllenstedt and R. Schwarzer

Erste Erfahrungen mit einer Ringblende im Emissions-Elektronenmikroskop Metioskop KE3.

BEDO 6 (1973) 495-506

419

C3

R. Schwarzer

Zur Abhängigkeit des Kontrastes in einem Emissions-Elektronen-Mikroskop von Art und Größe der Aperturblende.

BEDO 7 (1974) 351-362

449

C4

U. Fritz and R. Schwarzer

Erhöhte Bildhelligkeit im Photoemissions-Elektronenmikroskop Metioskop KE3 durch eine neuartige Anodenplatte.

BEDO 9 (1976) 157-166

558

C5

J. Hofmeister and R. Schwarzer

Der vektorielle Photoeffekt im Photoemissions-Elektronenmikroskop.

BEDO 9 (1976) 167-184

1.455

C6

R. Schwarzer

Transmissions-Kikuchi-Diagramme und Aufnahmen im konvergenten Elektronenbündel an epitaktisch aufgedampften Kupferschichten.

BEDO 10 (1977) 195-202

643

C7

K. Drescher and R. Schwarzer

Der Kontrast im Photoemission-Elektronenmikroskop bei der Auslösung durch kurz- und langwellige UV-Strahlung.

BEDO 10 (1977) 735-744

1.240

C8

U. Fritz and R. Schwarzer

Erhöhung des Kontrastes und der Bildhelligkeit im Photoemissions-Elektronenmikroskop durch Gasbelegungen auf Kupfer.

BEDO 10 (1977) 745-764

1.364

C9

R. Schwarzer and K.H. Gaukler

Long working distance ion gun using a field-ionization source.

Proc. 7th Intern. Vacuum Congress & 3rd Intern. Conference on Solid Surfaces, Vienna 1977, p. 2547-2549

93

C10

R. Schwarzer, J.I. Cisneros, and Z.P. Argüello

Messung der photoelektrischen Ausbeute und der Energieverteilung von Photoelektronen aus LiF-Einkristallen im Photoemissions-Elektronenmikroskop (PEEM).

BEDO 11 (1978) 209-214

341

C11

R.A. Schwarzer

Physical aspects of emission electron microscopy.

Proc. 1st EEM Conference, Tübingen 1979 / BEDO 12/2 (1979) 3-38

1.304

C12

R.A. Schwarzer

Evidence for vectorial photoelectric effect from PEEM study of biological thin sections.

Proc. 1st EEM Conference, Tübingen 1979 / BEDO 12/2 (1979) 165-170

805

C13

R.A. Schwarzer

Determination of fibre textures in thin gold films by evaluating pole figures with the TEM.

Proc. 10th Intern. Congress Electron Microscopy, Hamburg 1982, Vol. 2, p. 129-130

557

C14

R. Schwarzer

Intensitätskorrektur für die Messung von Polfiguren im TEM.

BEDO 16 (1983) 131-134

182

C15

R.A. Schwarzer and H. Weiland

Computer-aided indexing of Kikuchi patterns from cubic, tetragonal, and hexagonal crystals in the determination of grain orientations.

Proc. 8th Europ. Congr. EM (EUREM 1984), Budapest 1984, p. 341-342

177

C16

R. Schwarzer and H. Weiland

On-line computerized evaluation of Kikuchi patterns for the determination of preferred orienta­tions and orientation correlations.

Proc. 7th Intern. Conf. on Textures of Materials (ICOTOM 7), Holland 1984, p. 839-843

677

C17

H. Weiland and R. Schwarzer

The determination of preferred orientations with the TEM.

Proc. 7th Intern. Conf. on Textures of Materials (ICOTOM 7), Holland 1984, p. 857-862

644

C18

H. Weiland and R. Schwarzer

On-line Auswertung von Kikuchi- und Channelling-Diagrammen.

BEDO 18 (1985) 55-60

645

C19

R. Schwarzer

Polfigurmessung mit einem computergesteuerten Transmissions-Elektronenmikroskop.

BEDO 18 (1985) 61-68

471

C20

H. Weiland and R. Schwarzer

Automated polefigure measurements and determination of single grain orientations with a computer-controlled TEM.

Proc. 6th Intern. Congress Electron Microscopy, Kyoto 1986, p. 451

68

C21

R.A. Schwarzer and H. Weiland

Preferred crystal orientations studied with a computer-controlled transmission electron microscope.

Proc. Intern. Symposium on Electron Optics (ISEOB 86), Institute of Electronics, Academia Sinica, Beijing 1987, p. 222-224

27

C22

R.A. Schwarzer and H. Weiland

Measurement of local textures by electron diffraction - Comparison with X-ray texture analysis.

Proc. 8th Intern. Conf. on Textures of Materials (ICOTOM 8), Santa Fe 1987, p. 203-208

252

C23

H. Weiland, R.A. Schwarzer, and H.J. Bunge

The textures of ferrite and martensite in a dual-phase steel - measured sepa­rately by electron diffraction.

Proc. 8th Intern. Conf. on Textures of Materials (ICOTOM 8), Santa Fe 1987, p. 953-958

229

C24

R.A. Schwarzer

Quantitative TEM pole-figures of deformed titanium.

Proc. 9th Europ. Congr. Electron Microscopy (EUREM 88), York 1988, Inst. Physics Conf. Series No. 93 (1988), Vol. 2, p. 23-24

260

C25

L.M. Matthews and R.A. Schwarzer

Orientation determination of ferrite and lath martensite in a dual phase steel containing 12% Cr.

Proc. 9th Europ. Congr. Electron Microscopy (EUREM 88), York 1988, Inst. Physics Conf. Series No. 93 (1988), Vol. 2, p. 497-498

92

C26

R. Schwarzer

Die Aufnahme von Reflexions-Kikuchi-Diagrammen im REM mit einer peltiergekühlten, integrierenden CCD-Videokamera.

BEDO 22 (1989) 279-282

208

C27

R. Schwarzer

Röntgen-Rasterapparatur zur Aufnahme von Textur-Verteilungsbildern mittels energiedispersiver Beugung.

BEDO 22 (1989) 283-288

281

C28

R. Schwarzer

Die Ermittlung von Einzelorientierungen und Orientierungskorrelationen in Al-Sputterschichten.

BEDO 22 (1989) 357-360

233

C29

R.A. Schwarzer

Scanning x-ray microscopy for texture mapping by energy dispersive diffraction.

12th Intern. Congr. X-Ray Optics and Microanalysis, (12th IXCOM), Cracow 1989, p. 205-208

626

C30

R.A. Schwarzer

Electron diffraction texture analysis.

Proc. 1st Intern. Symp. on Advanced Materials, Islamabad 1989, p. 65-70

714

C31

R. Schwarzer

Elektronenmikroskopische Messung der Kristalltextur in IC-Metallisierungsschichten.

6. Tagung Festkörperanalytik, Karl-Marx-Stadt 1990, Tagungsband 7/1990 der TU Karl-Marx-Stadt, p. 70-71

83

C32

R. Schwarzer

Abbildende Röntgen-Rasterapparatur mit ED Beugung für Textur- und RF-Analysen.

6. Tagung Festkörperanalytik, Karl-Marx-Stadt 1990, Tagungsband 7/1990 der TU Karl-Marx-Stadt, p. 72-73

78

C33

R. Schwarzer

Röntgen-Rasterapparatur zur Abbildung von Texturfeldern mittels ED Beugung und zur RF-Analyse.

Proc. Arbeitskreis Röntgentopographie 1990 (Röto 90), p. 48-54

737

C34

R. Schwarzer

Kristalltextur und Hügelbildung in Dünnschichtmetallisierungen.

Proc. 5th Intern. Conference on Interconnection Technology in Electronics, Fellbach 1990, p. 73-76

258

C35

R.A. Schwarzer and H. Weiland

Electron microscopy for the determination of preferred crystal orientations - A concise review.

Proc. 12th Intern. Congr. for Electron Microscopy, Seattle 1990, Vol. 4, p. 434-435

 

C36

S. Zaefferer and R. Schwarzer

Automatisierte Messung von Einzelorientierungen im TEM.

BEDO 27 (1994) 159-168

555

C37

K. Kunze, S. Zaefferer, and R. Schwarzer

Orientierungs-Mapping mit dem Raster-Elektronenmikroskop.

BEDO 27 (1994) 169-176

449

C38

R.A. Schwarzer, K. Kunze and S. Zaefferer

The determination of microscale crystal texture.

Proc. 1st Slovene-German Seminar on Joint Projects in Materials Science and Technology,

Portoroz, 1994, ed. FZ Jülich, p. 41-46 ,    ISBN 3-89336-155-3

355

C39

R.A. Schwarzer, F. Springer, and S. Zaefferer

Crystal orientation mapping by digital beam scan and automated interpretation of backscatter Kikuchi patterns in the SEM.

Proc. 11th Intern. Conf. on Textures of Materials (ICOTOM 11), Xi'an (China) 1996, 43-52

1.089

C40

R.A. Schwarzer, N.C. Krieger Lassen, and B. Schäfer

Electron texture goniometer consisting of a TEM with side-entry goniometer and a CCD camera as an area detector.

Proc. 11th Intern. Conf. on Textures of Materials (ICOTOM 11), Xi'an (China) 1996, 170-175

299

C41

R.A. Schwarzer and M. Wehrhahn

Principles and applications of energy-dispersive x-ray diffraction texture imaging.

Proc. 11th Intern. Conf. on Textures of Materials (ICOTOM 11), Xi'an (China) 1996, 176-181

1.766

C42

F. Wagner, P. Obringer, R.A. Schwarzer, G. Goaer, and D. Sarti

The variation of microstructure in a polycrystalline silicon ingot.

Proc. 11th Intern. Conf. on Textures of Materials (ICOTOM 11), Xi'an (China) 1996, 1406-1409

46

 

C43

R.A. Schwarzer

Automated crystal orientation mapping (ACOM) of thin metallization layers and interconnects.

Proc. MRS 1997 Spring Meeting, Symp. I, San Francisco, March 31-April 4, 1997

Materials Research Society Symposium Proceedings Volume 472 (1997) 281-292

 

1.149

 

 

C44

A.H. Fischer, K. Helming, and R.A. Schwarzer     

Ortsaufgelöste Gefüge- und Texturanalyse mit einer Röntgenrasterapparatur auf der Basis eines Philips X'Pert MRD-Systems.

Tagungsband 9. Philips-Symposium Röntgenbeugung 1998 in Velen, Philips Kassel 1998, 67-77

 

159

 

C45

R.A. Schwarzer      

Orientation stereology by ACOM - A new means to characterize microstructure.

Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca 1998, 90

18

C46

F. Springer and R.A. Schwarzer

Applications of ACOM on bulk materials and thin films.

Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca 1998, 90

C47

A. Huot and R.A. Schwarzer

Texture of shear bands in Al-Mg3% (AA5182) and TiAl6V4 measured by BKD.

Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca 1998, 91

C48

B. Schäfer and R.A. Schwarzer

Measurement of SAD and RHEED pole figures by using a high-grade CCD camera as an area detector in the TEM.

Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca 1998, 92

C49

A.H. Fischer and R.A. Schwarzer

Mapping of texture, lattice strain and element distributions with an x-ray scanning apparatus.

Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca 1998, 92-93

C50

R.A. Schwarzer

Modern diffraction techniques for the structural analysis of metal surfaces.

Handbuch Fachrahmenprogramm Geospectra 99, Düsseldorf 1999, 42-43

163

C51

R.A. Schwarzer

Development of BKD hardware: Accomplishments and opportunities.

Proc. Microscopy and Microanalysis '99, Oregon 1999.

Microscopy and Microanalysis 5, Suppl. 2, (1999)242-243

12

C52

R.A. Schwarzer

Advancements of ACOM and applications to orientation stereology.

Proc. 12th Intern. Conf. on Textures of Materials (ICOTOM12), Montréal 1999, 52-61

366

C53

R.A. Schwarzer and A.H. Fischer

Mapping of lattice strain and texture distributions with an x-ray scanning apparatus.

Proc. 12th Intern. Conf. on Textures of Materials (ICOTOM 12), Montréal 1999, 204-210

 

213

C54

A. Huot, A.H. Fischer, A. von Glasow, and R.A. Schwarzer

Quantitative texture analysis of Cu damascene interconnects.

In: O. Kraft, E. Arzt, C.A. Volkert, P.S. Ho and H. Okabayashi (eds.): Proc. 5th Intern. Workshop on Stress-Induced Phenomena in Metallization, MPI Stuttgart 1999. AIP Conference Proceedings 491, Melville N.Y. 1999, 261-264    ISBN: 1563969041

174

C55

A.H. Fischer, A. von Glasow, A. Huot and R.A. Schwarzer

Crystal texture of electroplated damascene Cu interconnects.

Proc. Advanced Metallization Conference 1999 (AMC), Orlando (Florida),

Materials Research Society, 1999, 137-141

312

C56

P.P. Camus, D.B. Rohde, and R.A. Schwarzer
Considerations for Multi-Phase and Low-Symmetry COM Analyses. Microscopy and Microanalysis, 7 (S2) 2001, 362-363. DOI:10.1017/S1431927600027884

273

C57

R.A. Schwarzer
The characterization of microstructure by ACOM / EBSD and orientation stereology.
20th European Crystallographic Meeting (ECM 20) Cracow 2001

Book of Abstracts page 137    ISBN 83-88519-16-6

10

C58

J. Pospiech, R.A. Schwarzer, and K. Wiencek

Data Elaboration from Automatic Diffraction Measurement.

(in Polish language: Komputerowe opracowanie danych z automatycznych pomiarów dyfrakcyjnych.)

KomPlasTech 2003, Wisla Jawornik, 2003, 215-222

425

C59

J. Pospiech, M. Ostafin and R.A. Schwarzer

Tekstura i mikrostruktura (i ich wzajemne relacje) po walcowaniu poprzecznym i diagonalnym.

(in Polish language: Texture and microstructure (their mutual relation) after cross and oblique rolling. Seminar on the occasion of Prof. Z. Jasienski’s 70th birthday)

in: Niejednorodności odkształcenia w procesach przeróbki plastycznej i rekrystalizacji. Seminarium poświecone 70 rocznicy urodzin prof. Z. Jasieńskiego. PAN IMIM Kraków, 21 stycnia 2005, p. 49-59

 

C60

M. Søfferud, J. Hjelen, M. Karlsen, T. Breivik, N.C. Krieger Lassen, and
R. Schwarzer

Development of an ultra-fast EBSD detector system.
in: M. Luysberg, K. Tillmann, T. Weirich (Eds.), Proc. 14th European Microscopy Congress EMC2008 Vol.1: Instrumentation and Methods, Aachen, 1-5 Sept. 2008, Springer Berlin Heidelberg 2008

ISBN 978-3-540-85154-7 

45

C61

R. Schwarzer and J. Sukkau
Reproduzierbare EBSD-Messung im REM durch Pattern Streaming und off-line Auswertung.
Prakt. Metallographie Sonderband 45 (2013) 227-232

197

 

 

 

 

Books and various publications

 

 

 

 

B1

R. Schwarzer

Der Einfluß von Loch- und Ringblenden auf den Bildkontrast und die Energieverteilung der Elektronen im Emissions-Elektronenmikroskop.

PhD Thesis, University of Tübingen (Germany), 1975

 

B2

R. Schwarzer

Die Bestimmung der lokalen Textur mit dem Elektronenmikroskop.

Habilitation Thesis, Clausthal University of Technology, 1989

 

B3

R.A. Schwarzer and H. Weiland

Electron diffraction pole figure measurement.

in: H.J. Bunge (ed.): Experimental Techniques of Texture Analysis. DGM-Verlagsgesellschaft, Oberursel and New York 1986, p. 287-300

1.149

B4

H. Weiland and R. Schwarzer

On-line texture determination by Kikuchi or channeling patterns.

in H.J. Bunge (ed.): Experimental Techniques of Texture Analysis. DGM-Verlagsgesellschaft, Oberursel and New York 1986, p. 301-313

647

B5

R.A. Schwarzer

Crystal texture analysis by means of electron diffraction.

in H.J. Bunge and C. Esling (eds.): Advances and Applications of Quantitative Texture Analysis.

DGM-Verlagsgesellschaft, Oberursel and New York 1991, p. 51-72

1.435

B6

R.A. Schwarzer (ed.)

Proceedings International Conference on Texture and Microstructure of Polycrystals, ITAP-1, Clausthal 22 - 25 September 1997

Materials Science Forum 273-275(1998)                ISBN: 0-87849-802-8

 

B7

R.A. Schwarzer

Automated electron backscatter diffraction: Present state and prospects.

in: A. Schwartz, M. Kumar and B.L. Adams (eds.): Electron Backscatter Diffraction in Materials Science, Kluwer Academic / Plenum Publishers, 2000, p. 105-122    ISBN: 0-306-46487-X

543

B8

R.A. Schwarzer

Modern diffractions techniques for texture analysis.

In R.K. Ray et al. (eds.): Materials for the Third Millenium, Oxford & IBH Publ. Co., New Delhi 2001, p. 171-195

 

 

586

B9

C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner (eds.)

Proceedings 2nd International Conference on Texture and Microstructure of Polycrystals, ITAP-2, Metz, July 7-9, 2004

Solid State Phenomena vol. 105 (2005)       ISBN: 3-908451-09-4

 

B10

L. Spieß, R. Schwarzer, H. Behnken and G. Teichert

Moderne Röntgenbeugung - Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker.

Teubner B.G. GmbH Verlag, 2005              ISBN: 3-519-00522-0

20.431

Chapter 11

2.655

B11

R.A. Schwarzer

Texture mapping by scanning X-ray diffraction and related methods.

In: A.K. Singh (ed.): Advanced X-ray Techniques in Research and Industry.

IOS Press, Amsterdam, The Netherlands, 2005, p. 50-65    

ISBN: 1-58603-537-1

Indian edition: Capital Publishing Company, New Delhi, 2006   

ISBN: 81-85589-41-0

634

B12

D. Rammlmair, M. Wilke, K. Rickers, R.A. Schwarzer, A. Möller and A. Wittenberg

Methodological Developments and Applications – 7.6 Geology, Mining, Metallurgy. in: B. Beckhoff, B. Kanngießer, N. Langhoff, R. Wedell and H. Wolff (eds.): Handbook of Practical X-Ray Fluorescence Analysis.

Springer-Verlag Berlin Heidelberg 2006, S.640-687         

ISBN 3-540-28603-9

1.208

B13

 L. Spieß, G. Teichert, R. Schwarzer, H. Behnken, and Ch. Genzel
 
Moderne Röntgenbeugung - Röntgendiffraktometrie für Materialwissen-  schaftler, Physiker und Chemiker. 2nd edition
Vieweg + Teubner 2009             ISBN: 978-3-8351-0166-1

16.341
Chapt.
11&14
3.579

B14

H. Klein and R.A. Schwarzer (eds.)

Proceedings 3rd International Conference on Texture and Microstructure of Polycrystals, ITAP-3, Göttingen, 23-25 September 2009
 
Solid State Phenomena vol. 160 (2010)     ISBN: 3-908451-78-7

 
ISBN-13 978-3-908451-78-5

 

B15

  R.A. Schwarzer, D.P. Field, B.L. Adams, M. Kumar,  and A.J. Schwartz
 
Chapter 1: Present State of Electron Backscatter Diffraction and 
 
Prospective Developments.
in: A.J. Schwartz et al. (eds.): Electron
 
Backscatter Diffraction in Materials Science.
Springer Science+Business Media, New York (2009),  p. 1-20 
 
EAN: 9780387881355     ISBN-10:0-387-88135-2

546

B16

 H.J. Bunge and R.A. Schwarzer
Crystallographic Texture and Plastic Anisotropy. in: D. Banabic (ed.):    Multiscale Modelling in Sheet Metal Forming.
Springer Intern. Publishing Switzerland 2016, p. 47-78    ISBN 978-3-319-44068-2

1.194

B17

L. Spieß, G. Teichert, R. Schwarzer, H. Behnken, and Ch. Genzel
 
Moderne Röntgenbeugung - Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker. 3nd edition
Spinger Spektrum 2019             ISBN: 978-3-8348-1219-3

14.243

 


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