|
#
|
Articles published in journals
|
available
in kB
|
|
A1
|
K.H. Gaukler and R. Schwarzer
Verbessertes Verfahren zur Bestimmung des mittleren inneren Potentials
aus Reflexions-Kikuchi-Diagrammen.
Optik 33 (1971) 215-229
|
424
|
|
A2
|
K.H. Gaukler and R. Schwarzer
Elektronen-Emissions-Mikroskopie (Review article).
Messtechnik 81 (1973) 307-316
|
1190
|
|
A3
|
J. Hofmeister and R. Schwarzer
Zum Einfluß der kristallographischen Orientierung auf den vektoriellen
Photoeffekt.
Physics Letters 53A (1975) 283-284
|
501
|
|
A4
|
G.H. Hartmann, H.P. Niemitz and
R.A. Schwarzer
Bestimmung des mittleren inneren Potentials von Diamant und von
Vanadium-Pentoxid aus Reflexions- Kikuchi- Diagrammen.
Optik 44 (1975) 37-43
|
488
|
|
A5
|
R. Schwarzer
Der Einfluß von Loch- und Ringblenden auf die Energieverteilung der
Elektronen im Emissions-Elektronenmikroskop.
Optik 44 (1975) 61-78
|
1078
|
|
A6
|
R. Schwarzer
Die Verbesserung des Bildkontrastes im Emissions-Elektronenmikroskop
durch eine ringförmige Aperturblende.
Optik 44 (1975) 121-131
|
533
|
|
A7
|
M.B. Trullenque, Z.P. Argüello and R.A. Schwarzer
Investigations of ionic crystals with the photoemission electron
microscope.
Revista Microscopia Electrónica 3 (1976) 156-157
|
252
|
| A7a |
R.A. Schwarzer, J.I. Cisneros, M. Tomyiama, Shih-Lin
Chang and Z.P. Argüello
Study of orientation contrast and information depth in
LiF with the photoemission electron microscope (PEEM).
Revista de Microscopía
Electrónica 5 (1978) |
288 |
|
A8
|
W. May, E.A. Farah and R.
Schwarzer
EMA and PEEM studies of WC-Ti interface reactions.
Revista Microscopia Electrónica 3 (1976) 190-191
|
390
|
|
A9
|
R. Schwarzer and K.H. Gaukler
Erzeugung einer Ionen-Mikrosonde mittels Feldionisation und
Emissionslinse.
Vakuum-Technik 27 (1978) 2-5
|
81
|
|
A10
|
R. Schwarzer
Die Bestimmung von Strukturpotentialen aus
Kossel-Möllenstedt-Diagrammen an epitaktisch aufgedampften,
freitragenden Kupfereinkristallschichten.
Optik 54 (1979) 193-199
|
190
|
|
A11
|
R.A. Schwarzer
Emission electron microscopy - A review. Part 1: Basic concepts and
applications in physics.
Microscopica Acta 84 (1981) 51-86
|
1961
|
|
A12
|
R.A. Schwarzer
Bestimmung von Polfiguren und Texturanalyse mit dem
Transmissions-Elektronenmikroskop.
Z. Metallkunde 73 (1982) 495-498
|
507
|
|
A13
|
R.A. Schwarzer
On-line measurement of foil thickness from Kossel-Möllenstedt
diffraction patterns.
Optik 77 (1987) 55-56
|
179
|
|
A14
|
R.A. Schwarzer and H. Weiland
Texture analysis by the measurement of individual grain orientations -
Electron microscopical methods and application on dual-phase steel.
Textures and Microstructures 8&9 (1988) 551-577
|
1459
|
|
A15
|
R.A. Schwarzer
Measurement of local textures with transmission and scanning electron
microscopes.
Textures and Microstructures 13 (1990) 15-30
|
1502
|
|
A16
|
R. Schwarzer
Die Kristalltextur in der Mikroelektronik.
Teil 1. Elektronenmikroskopische Meßverfahren.
Verbindungstechnik in der Elektronik 3 (1991) Heft 1, 16-20
Teil 2. Hügelbildung in dünnen Metallisierungsschichten.
Verbindungstechnik in der Elektronik 3 (1991) Heft 2, 56-59
|
1419
|
|
A17
|
R.A. Schwarzer
A review of the analysis of local texture by electron diffraction.
Textures and Microstructures 14-18 (1991) 85-90
|
799
|
|
A18
|
R.A. Schwarzer
Scanning X-ray apparatus for texture mapping by energy dispersive
diffraction.
Textures and Microstructures 14-18 (1991) 241-244
|
478
|
|
A19
|
R.A. Schwarzer
Texture analysis by electron diffraction.
Steel Research 62 (1991) 542-547
|
1614
|
|
A20
|
D. Gerth, D. Katzer and R.
Schwarzer
Correlation between grain growth and hillock growth in thin thermally
annealed Al-1%Si films on silicon substrates.
Materials Science Forum 94-96 (1992) 557-562 / Proc. Intern. Conf. on
Grain Growth in Polycrystalline Materials, Rome 1991
|
273
|
|
A21
|
D. Gerth and R.A. Schwarzer
The development of grain-specific texture and grain boundary character
during grain growth of Al-1%Si films on SiO2/Si substrates.
Materials Science Forum 113-115 (1993) 619-624 / Proc. Intern.
Conf. on Recrystallization and Related Phenomena (Recrystallization
'92), San Sebastian 1992
|
126
|
|
A22
|
D. Gerth and R.A. Schwarzer
The effect of grain-specific texture on hillock growth in Al-1%Si films
on SiO2/Si substrates.
Materials Science Forum 113-115 (1993) 625-630 / Proc. Intern.
Conf. on Recrystallization and Related Phenomena (Recrystallization
'92), San Sebastian 1992
|
246
|
|
A23
|
S. Zaefferer and R.A. Schwarzer
Microstructure and local texture of partially recrystallized titanium
sheet.
Materials Science Forum 113-115 (1993) 721-724 / Proc. Intern.
Conf. on Recrystallization and Related Phenomena (Recrystallization
'92), San Sebastian 1992
|
114
|
|
A24
|
R.A. Schwarzer
Crystal texture analysis of ceramics by electron microscopy.
Ceramika 42 (1993) 59-65 / Polski Biuletyn Ceramiczny 4 (1993)
|
100
|
|
A25
|
R.A. Schwarzer
The determination of local texture by electron diffraction - A tutorial
review.
Textures and Microstructures 20 (1993) 7-27
|
3495
|
|
A26
|
D. Gerth and R.A. Schwarzer
Graphical representation of grain and hillock orientations in annealed
Al-1%Si films.
Textures and Microstructures 21 (1993) 177-193
|
774
|
|
A27
|
R.A. Schwarzer and D. Gerth
The effect of grain orientation on the relaxation of thermomechanical
stress in Al-1%Si conductor layers on SiO2/Si substrates.
Journal of Electronic Materials 22 (1993) 607-610
|
1039
|
|
A28
|
R.A. Schwarzer
Texture distributions imaged by energy dispersive x-ray diffraction.
Steel Research 64 (1993) 570-574
|
1157
|
|
A29
|
R.A. Schwarzer
A CCD camera system for the acquisition of backscatter Kikuchi patterns
on an SEM.
Materials Science Forum 157-162 (1994) 187-188 / Proc. ICOTOM
10, Clausthal 1993
|
100
|
|
A30
|
R.A. Schwarzer and S. Zaefferer
An inexpensive CCD camera system for recording and on-line
interpretation of TEM Kikuchi patterns.
Materials Science Forum 157-162 (1994) 189-194 / Proc. ICOTOM
10, Clausthal 1993
|
312
|
|
A31
|
R.A. Schwarzer and S. Zaefferer
On-line interpretation of SAD channeling patterns.
Materials Science Forum 157-162 (1994) 195-200 / Proc. ICOTOM
10, Clausthal, 1993
|
176
|
|
A32
|
R.A. Schwarzer
Preparation of high-resistance or sensitive samples for grain
orientation measurements with electron microscopes.
Materials Science Forum 157-162 (1994) 201-206 / Proc. ICOTOM
10, Clausthal 1993
|
272
|
|
A33
|
S. Zaefferer and R.A. Schwarzer
On-line determination of complete deformation systems for cubic and
hexagonal crystals in the TEM.
Materials Science Forum 157-162 (1994) 241-246 / Proc. ICOTOM
10, Clausthal 1993
|
383
|
|
A34
|
S. Zaefferer and R.A. Schwarzer
On-line interpretation of spot and Kikuchi patterns.
Materials Science Forum 157-162 (1994) 247-250 / Proc. ICOTOM
10, Clausthal 1993
|
188
|
|
A35
|
W. Xia and R.A. Schwarzer
PC program for the calculation of ODF from SAD pole figures or from
individual grain orientations.
Materials Science Forum 157-162 (1994) 487-492 / Proc. ICOTOM
10, Clausthal 1993
|
300
|
|
A36
|
M. Barthel, D. Gerth, R.A.
Schwarzer, P. Klimanek and U. Messerschmidt
Individual grain orientation relations after high-speed hot rolling of
steel rods.
Materials Science Forum 157-162 (1994) 1131-1136 / Proc. ICOTOM
10, Clausthal 1993
|
479
|
|
A37
|
D. Gerth, S. Zaefferer and R.A.
Schwarzer
Stress-induced grain growth in thin Al-1% Si films on SiO2/Si
substrates.
Materials Science Forum 157-162 (1994) 1205-1210 / Proc.
ICOTOM 10, Clausthal 1993
|
1304
|
|
A38
|
K. Helming and R.A. Schwarzer
Texture estimate from minimum ranges of SAD pole figures.
Materials Science Forum 157-162 (1994) 1219-1224 / Proc. ICOTOM
10, Clausthal 1993
|
264
|
|
A39
|
S. Zaefferer, D. Gerth and R.A.
Schwarzer
Determination of local texture and deformation systems in TiAl6V4 and
T40.
Materials Science Forum 157-162 (1994) 1319-1324 / Proc.
ICOTOM 10, Clausthal 1993
|
523
|
|
A40
|
D. Gerth and R.A. Schwarzer
Local mechanical properties in thin Al layers on Si substrates
calculated from measured grain orientations.
Materials Science Forum 157-162 (1994) 1571-1576 / Proc. ICOTOM
10, Clausthal 1993
|
240
|
|
A41
|
K. Helming, R.A. Schwarzer, B.
Rauschenbach, S. Geier, B. Leiss, H.-R.Wenk, K. Ullemeyer and J. Heinitz
Texture estimates by means of components.
Z. Metallkunde 85 (1994) 545-553
|
1627
|
|
A42
|
M. Wehrhahn and R.A. Schwarzer
Crystal texture mapping by energy dispersive x-ray diffraction.
Z. Metallkunde 85 (1994) 581-584
|
321
|
|
A43
|
S. Zaefferer and R.A. Schwarzer
Automated measurement of single grain orientations in the TEM.
Z. Metallkunde 85 (1994) 585-591
|
403
|
|
A44
|
D. Gerth, D. Katzer and R.A.
Schwarzer
The influence of local thermomechanical stress on grain growth in thin
Al-1%Si layers on SiO2/Si substrates.
Physica status solidi (a) 146 (1994) 299-316
|
1360
|
|
A45
|
R.A. Schwarzer and S. Zaefferer
Automated measurement of grain orientations and on-line determination
of complete deformation systems with a TEM.
Advances in X-Ray Analysis 38 (1995) 377-381
|
235
|
|
A46
|
R.A. Schwarzer and M. Wehrhahn
Scanning x-ray apparatus for crystal texture mapping and
micro-fluorescence analysis.
Advances in X-Ray Analysis 38 (1995) 383-385
|
115
|
|
A47
|
R.A. Schwarzer, S. Zaefferer
and K. Kunze
The characterization of microtexture by orientation mapping.
Advances in X-Ray Analysis 38 (1995) 547-550
|
144
|
|
A48
|
K. Helming, B. Rauschenbach and
R.A. Schwarzer
Analysis of crystallographic texture in small sample areas.
Textures and Microstructures 26-27 (1996) 111-124
|
899
|
|
A49
|
R.A. Schwarzer
The study of crystal texture by electron diffraction on a
grain-specific scale.
Microscopy and Analysis 45 (1997) 35-37
|
1574
|
|
A50
|
R.A. Schwarzer and M. Wehrhahn
X-ray scanning apparatus for mapping texture and element distributions.
Textures and Microstructures 29 (1997) 65-76
|
918
|
|
A51
|
R.A. Schwarzer
Advances in crystal orientation mapping with SEM and TEM.
Ultramicroscopy 67 (1997) 19-24
|
444
|
|
A52
|
R.A. Schwarzer
Review Paper: Automated crystal lattice orientation mapping using a
computer-controlled SEM.
Micron 28 (1997) 249-265
|
702
|
|
A53
|
R.A. Schwarzer and J. Sukkau
Automated crystal orientation mapping (ACOM) with a computer-controlled
TEM by interpreting transmission Kikuchi patterns.
Materials Science Forum 273-275 (1998) 215-222
|
731
|
|
A54
|
B. Schäfer and R.A. Schwarzer
SAD pole figures in transmission and reflection using a high-grade CCD
camera as an area detector.
Materials Science Forum 273-275 (1998) 223-228
|
137
|
|
A55
|
A.H. Fischer and R.A. Schwarzer
X-ray pole figure measurement and texture mapping of selected areas
using an X-ray scanning apparatus.
Materials Science Forum 273-275 (1998) 255-262
|
547
|
|
A56
|
A.H. Fischer, D. Weirauch and
R.A. Schwarzer
Peltier-cooled solid state drift-chamber detector for energy dispersive
X-ray pole-figure measurement and texture mapping.
Materials Science Forum 273-275 (1998) 263-269
|
670
|
|
A57
|
A. Huot, R.A. Schwarzer and
J.H. Driver
Texture of shear bands in Al-Mg3% (AA5182) measured by BKD.
Materials Science Forum 273-275 (1998) 319-326
|
493
|
|
A58
|
A. Ziegenbein, H. Neuhäuser, J.
Thesing, R. Ritter, H. Wittich, E. Steck, F. Springer and R.A. Schwarzer
Investigations on local plasticity of CuAl polycrystals by in-situ
observations and FEM simulations.
Materials Science Forum 273-275 (1998) 363-368
|
264
|
|
A59
|
M. Lepper, A. von Glasow, D.
Piscevic and R.A. Schwarzer
Crystal texture and electromigration damage in Al-based interconnect
lines studied by ACOM with the SEM.
Materials Science Forum 273-275 (1998) 573-577
|
193
|
|
A60
|
A.H. Fischer and R.A. Schwarzer
Mapping of local residual strain with an X-ray scanning apparatus.
Materials Science Forum 273-275 (1998) 673-677
|
128
|
|
A61
|
R.A. Schwarzer
Local crystal textures: experimental techniques and future trends.
Fresenius J. Anal. Chem. 361 (1998) 522-526
|
451
|
|
A62
|
R.A. Schwarzer
Crystallography and microstructure of thin films studied by X-ray and
electron diffraction.
Materials Science Forum 287-288 (1998) 23-60
Proc. 6th Intern. Symposium on Trends and New Applications of Thin
Films, Regensburg 18-20 March 1998
|
911
|
|
A63
|
R.A. Schwarzer
Automated crystal orientation mapping (ACOM) - a new perspective on the
characterization of microstructure.
Bulletin Czech and Slovak Crystallographic Association 5 (1998)
35-36
(Special Issue A - ECM-18)
|
89
|
|
A64
|
H.J. Bunge and R.A. Schwarzer
Orientierungsstereologie - ein neuer Zweig der Texturforschung.
TU Contact 2 (1998) 67-73
|
2093
|
|
A65
|
S. Kittelberger, U. Bolz, R.P.
Huebener, B. Holzapfel, L. Mex and R.A. Schwarzer
Transient local resistivity maximum during temperature dependent oxygen
diffusion in YBa2Cu3O7-δ thin films.
Physica C 312 (1999) 7-20
|
2887
|
|
A66
|
R. Schwarzer and A.H. Fischer
Ortsaufgelöste Textur- und Gitterdehnungsanalyse mit einer
Röntgenrasterapparatur.
TU Contact 5 (1999) 49-53
|
1682
|
|
A67
|
R.A. Schwarzer and A. Huot
The study of microstructure on a mesoscale by ACOM.
Crystal Research and Technology 35 (2000) 851-862
|
208
|
|
A68
|
A.K. Singh and R.A. Schwarzer
Texture and anisotropy of mechanical properties in Titanium and its
alloys.
Z. Metallkunde 91 (2000) 702-716
|
8469
|
|
A69
|
R.A. Schwarzer, A.K. Singh and
J. Sukkau
Discrimination and mapping of phase distributions by ACOM.
Materials Science and Technology 16 (2000) 1389-1392
|
1657
|
|
A70
|
R.A. Schwarzer
Measurement of macro-texture by ACOM - an alternative to XRD.
Materials Science and Technology 16 (2000) 1384-1388
|
1556
|
|
A71
|
H.J. Bunge and R.A. Schwarzer
Orientation stereology - a new branch in texture research.
Advanced Engineering Materials 3 (2001) 25-39
|
669
|
|
A72
|
A.K. Singh and R.A. Schwarzer
Effect of mode of deformation by rolling on the development of texture
in binary Ti-Mn alloys.
Scripta Materialia 44 (2001) 375-380
|
606
|
|
A73
|
A.K. Singh and R.A. Schwarzer
Texture of hot rolled and annealed binary Ti-Mn alloys.
Z. Metallkunde 92 (2001) 184-190
|
3929
|
|
A74
|
A.K. Singh and R.A. Schwarzer
Evolution of cold rolling texture in the binary alloys Ti-0.4Mn and
Ti-1.8 Mn.
Materials Science and Engineering A 307 (2001) 151-157
|
349
|
|
A75
|
R.A. Schwarzer
EBSD studies of interconnect lines.
Revue de Métallurgie - SF2M - JA2001 (2001) 65
|
181
|
|
A76
|
R.A. Schwarzer
Phase discrimination by automated BKD.
Analytical and Bioanalytical Chemistry (ABC) 374 (2002) 699-702
|
301
|
|
A77
|
R.A. Schwarzer and J. Sukkau
Automated evaluation of Kikuchi patterns by means of Radon and Fast
Fourier Transformations, and verification by an Artificial Neural
Network.
Advanced Engineering Materials 5 (2003) 601-606
|
268
|
|
A78
|
I.V. Gervas'eva, B.K. Sokolov,
R.A. Schwarzer, V.V. Gubernatorov and Ya. V. Podkin
Effect of the initial grain size on the structural inhomogeneity and
texture formation upon cold rolling and annealing of the Fe-3% Si alloy.
The Physics of Metals and Metallography 96 Suppl. 1 (2003)
S43-S52
|
1044
|
|
A79
|
R.A. Schwarzer
Automated grain orientation measurement by backscatter Kikuchi
diffraction.
The Physics of Metals and Metallography 96 Suppl. 1 (2003)
S104-S115
|
811
|
|
A80
|
J. Pospiech, M. Ostafin and
R.A. Schwarzer
Microstructural aspects of crossrolling of copper.
Inzynieria Matrialowa 24 (2003) 802-805
|
373
|
|
A81
|
Z. Jasienski, J. Pospiech, R.
Schwarzer, A. Piatkowski and A. Litwora
Inhomogeneity of deformation induced by the change of deformation path
in channel-die compressed (112)[11-1] copper single crystals.
Inzynieria Matrialowa 25 (2004) 359-363
|
513
|
|
A82
|
Z. Jasienski, J. Pospiech, A.
Piatkowski, R. Schwarzer, A. Litwora and M.Ostafin
Textural and structural effects of the change of deformation path in
copper single crystals in a channel-die test.
Archives of Metallurgy and Materials 49 (2004) 11-28
|
962
|
|
A83
|
R.A. Schwarzer
Texture in hot extruded, hot rolled and laser welded magnesium base
alloys.
Solid State Phenomena 105 (2005) 23-28
|
310
|
|
A84
|
M. Ostafin, J. Pospiech and
R.A. Schwarzer
Microstructure and texture in copper sheets after reverse and cross
rolling.
Solid State Phenomena 105 (2005) 309-314
|
404
|
|
A85
|
J. Pospiech, Z. Jasienski, M.
Ostafin and R.A. Schwarzer
Local and global effects in texture and microstructure observed after
channel-die compression of copper single crystals and after
cross-rolling of copper sheets.
Solid State Phenomena 105 (2005) 321-326
|
252
|
|
A86
|
R.A. Schwarzer
Deformation textures of fcc metals subjected to frictional and abrasive
wear.
Solid State Phenomena 105 (2005) 195-200
|
119
|
|
A87
|
A.K. Singh and R.A. Schwarzer
Evolution of texture in pure magnesium during rolling.
Z. Metallkunde 96 (2005) 345- 351
|
492
|
|
A88
|
R.A. Schwarzer
Advances in the analysis of texture and microstructure.
Archives of Metallurgy and Materials 50 (2005) 7-20
|
278
|
|
A89
|
M. Ostafin, J. Pospiech and
R.A. Schwarzer
The evolution of deformation texture in copper by unidirectional and by
cross rolling.
Archives of Metallurgy and Materials 50 (2005) 403-409
|
107
|
|
A90
|
R.A. Schwarzer
Local texture and back-end defect in hot extruded AZ91 magnesium alloy.
Z. Metallkunde 96 (2005) 1005-1008
|
260
|
|
A91
|
R.A. Schwarzer
Automated crystal orientation measurement by backscatter Kikuchi diffraction.
Z. Kristallographie Suppl. 23 (2006) 163-168
|
108
|
|
A92
|
J. Pospiech, M. Ostafin and R.
Schwarzer
The effect of the rolling geometry on the texture and microstructure in
AZ31 and copper.
Archives of Metallurgy and Materials 51 (2006) 37-42
|
483
|
|
A93
|
A.K. Singh and R.A. Schwarzer
Development of cold rolling texture in the binary Ti-0.4Mn alloy.
Metals Materials and Processes 18 (2006) 351-360
|
578
|
|
A94
|
B.K. Sokolov, I.V. Gervas'eva,
D.P. Rodionov, R.A. Schwarzer and Ya. V. Podkin
Effect of deformation inhomgeneities on the formation of texture during
cold rolling and annealing of nickel single crystals.
The Physics of Metals and Metallography 102 (2006) 439-451
|
517
|
|
A95
|
R.A. Schwarzer
The preparation of Mg, Cd and Zn samples for crystal orientation
mapping with BKD in an SEM.
Microscopy Today 15 March issue (2007) 40, 42
|
368
|
|
A96
|
H.-G. Brokmeier, S. Lenser, R.
Schwarzer, V. Ventzke, S. Riekehr, M. Kocak and J. Homeyer
Crystallographic texture of dissimilar laser welded Al5083-Al6013
sheets.
Materials Science Forum 539-543 (2007) 3894-3899
|
1767
|
|
A97
|
A.K. Singh and R.A.
Schwarzer
Evolution of texture during thermomechanical processing of Titanium and
its alloys.
Trans. Indian Inst. Met. 61 (2008) 371-387
|
621
|
|
A98
|
R.A. Schwarzer
Spatial resolution in ACOM - What will come after EBSD.
Microscopy Today 16 January issue (2008) 5-10
|
196
|
|
A99
|
R.A. Schwarzer
A fast ACOM/EBSD system.
Archives of Metallurgy and Materials 53 (2008) 5-10
|
155
|
|
A100
|
R.A. Schwarzer and J. Hjelen
High-speed orientation microscopy with offline solving sequences of
EBSD patterns.
Solid State Phenomena 160 (2010) pp 295-300
|
116
|
|
A101
|
R.A. Schwarzer
Orientation microscopy with Fast EBSD
Materials Science and Technology 26 (2010) 646-649
|
107
|
|
A102
|
J. Sukkau and R.A.
Schwarzer
Reconstruction of Kikuchi patterns by intensity-enhanced Radon
transformation.
Pattern
Recognition Letters 33 (2012) 739-743
|
390
|
|
A103
|
R.A. Schwarzer and J. Sukkau
Electron Back Scattered Diffraction: Current state, prospects and
comparison with X-ray diffraction texture measurement.
The Banaras Metallurgist 18 (2013) 1-11
|
219
|
| A104 |
R. Schwarzer
Orientation microscopy using the analytical scanning electron
microscope.
Practical Metallography 51 (2014) 160-179
|
422 |
| A105 |
R.A. Schwarzer and
J. Hjelen
Backscattered electron imaging wih an EBSD detector.
Microscopy Today 23 January Issue (2015) 12-17 |
2062 |
| A106 |
R. Schwarzer and C. Esling
Texture et anisotropie des matériaux polycristallins - Cartographie par diffraction de Kikuchi.
Techniques de l'Ingénieur - Matériaux: M3040 V2 (2021) 1-16 & DOC M3040 V2 (2021) 1-3
DOI 10.51257/a-v2-m3040
|
2290 |
|
Conference Proceedings
|
|
C1
|
R. Schwarzer, W. Leiser and
K.H. Gaukler
Untersuchungen mit dem Photoemissions-Elektronenmikroskop (PhEEM).
BEDO (= Beiträge zur elektronenmikroskop. Direktabbildung von
Oberflächen) 5 (1972) 977-986
|
400
|
|
C2
|
G. Möllenstedt and R. Schwarzer
Erste Erfahrungen mit einer Ringblende im Emissions-Elektronenmikroskop
Metioskop KE3.
BEDO 6 (1973) 495-506
|
419
|
|
C3
|
R. Schwarzer
Zur Abhängigkeit des Kontrastes in einem Emissions-Elektronen-Mikroskop
von Art und Größe der Aperturblende.
BEDO 7 (1974) 351-362
|
449
|
|
C4
|
U. Fritz and R. Schwarzer
Erhöhte Bildhelligkeit im Photoemissions-Elektronenmikroskop Metioskop
KE3 durch eine neuartige Anodenplatte.
BEDO 9 (1976) 157-166
|
558
|
|
C5
|
J. Hofmeister and R. Schwarzer
Der vektorielle Photoeffekt im Photoemissions-Elektronenmikroskop.
BEDO 9 (1976) 167-184
|
1455
|
|
C6
|
R. Schwarzer
Transmissions-Kikuchi-Diagramme und Aufnahmen im konvergenten
Elektronenbündel an epitaktisch aufgedampften Kupferschichten.
BEDO 10 (1977) 195-202
|
643
|
|
C7
|
K. Drescher and R. Schwarzer
Der Kontrast im Photoemission-Elektronenmikroskop bei der Auslösung
durch kurz- und langwellige UV-Strahlung.
BEDO 10 (1977) 735-744
|
1240
|
|
C8
|
U. Fritz and R. Schwarzer
Erhöhung des Kontrastes und der Bildhelligkeit im
Photoemissions-Elektronenmikroskop durch Gasbelegungen auf Kupfer.
BEDO 10 (1977) 745-764
|
1364
|
|
C9
|
R. Schwarzer and K.H. Gaukler
Long working distance ion gun using a field-ionization source.
Proc.7th Intern. Vacuum Congress & 3rd Intern. Conference on Solid
Surfaces, Wien 1977, 2547-2549
|
93
|
|
C10
|
R. Schwarzer, J.I. Cisneros and
Z.P. Arguello
Messung der photoelektrischen Ausbeute und der Energieverteilung von
Photoelektronen aus LiF-Einkristallen im
Photoemissions-Elektronenmikroskop (PEEM).
BEDO 11 (1978) 209-214
|
341
|
|
C11
|
R.A. Schwarzer
Physical aspects of emission electron microscopy.
Proc. 1st EEM Conference, Tübingen 1979 / BEDO 12/2 (1979) 3-38
|
1304
|
|
C12
|
R.A. Schwarzer
Evidence for vectorial photoelectric effect from PEEM study of
biological thin sections.
Proc. 1st EEM Conference, Tübingen 1979 / BEDO 12/2 (1979)
165-170
|
805
|
|
C13
|
R.A. Schwarzer
Determination of fibre textures in thin gold films by evaluating pole
figures with the TEM.
Proc. 10th Intern. Congress Electron Microscopy, Hamburg 1982, Vol. 2,
129-130
|
557
|
|
C14
|
R. Schwarzer
Intensitätskorrektur für die Messung von Polfiguren im TEM.
BEDO 16 (1983) 131-134
|
182
|
|
C15
|
R.A. Schwarzer and H. Weiland
Computer-aided indexing of Kikuchi patterns from cubic, tetragonal, and
hexagonal crystals in the determination of grain orientations.
Proc. 8th European Congress on Electron Microscopy (EUREM 1984),
Budapest 1984, 341-342
|
177
|
|
C16
|
R. Schwarzer and H. Weiland
On-line computerized evaluation of Kikuchi patterns for the
determination of preferred orientations and orientation correlations.
Proc. 7th Intern. Conf. on Textures of Materials (ICOTOM 7), Holland
1984, 839-843
|
677
|
|
C17
|
H. Weiland and R. Schwarzer
The determination of preferred orientations with the TEM.
Proc. 7th Intern. Conf. on Textures of Materials (ICOTOM 7), Holland
1984, 857-862
|
644
|
|
C18
|
H. Weiland and R. Schwarzer
On-line Auswertung von Kikuchi- und Channelling-Diagrammen.
BEDO 18 (1985) 55-60
|
645
|
|
C19
|
R. Schwarzer
Polfigurmessung mit einem computergesteuerten
Transmissions-Elektronenmikroskop.
BEDO 18 (1985) 61-68
|
471
|
|
C20
|
H. Weiland and R. Schwarzer
Automated polefigure measurements and determination of single grain
orientations with a computer-controlled TEM.
Proc. 6th Intern. Congress Electron Microscopy, Kyoto 1986, 451
|
68
|
|
C21
|
R.A. Schwarzer and H. Weiland
Preferred crystal orientations studied with a computer-controlled
transmission electron microscope.
Proc. Intern. Symposium on Electron Optics (ISEOB 86), Institute of
Electronics, Academia Sinica, Beijing 1987, 222-224
|
27
|
|
C22
|
R.A. Schwarzer and H. Weiland
Measurement of local textures by electron diffraction - Comparison with
X-ray texture analysis.
Proc. 8th Intern. Conf. on Textures of Materials (ICOTOM 8), Santa Fe
1987, 203-208
|
252
|
|
C23
|
H. Weiland, R.A. Schwarzer and
H.J. Bunge
The textures of ferrite and martensite in a dual-phase steel - measured
separately by electron diffraction.
Proc. 8th Intern. Conf. on Textures of Materials (ICOTOM 8), Santa Fe
1987, 953-958
|
229
|
|
C24
|
R.A. Schwarzer
Quantitative TEM pole-figures of deformed titanium.
Proc. 9th Europ. Congr. Electron Microscopy (EUREM 88), York 1988,
Inst. Physics Conf. Series No. 93 (1988), Vol. 2, 23-24
|
260
|
|
C25
|
L.M. Matthews and R.A. Schwarzer
Orientation determination of ferrite and lath martensite in a dual
phase steel containing 12% Cr.
Proc. 9th Europ. Congr. Electron Microscopy (EUREM 88), York 1988,
Inst. Physics Conf. Series No. 93 (1988), Vol. 2, 497-498
|
92
|
|
C26
|
R. Schwarzer
Die Aufnahme von Reflexions-Kikuchi-Diagrammen im REM mit einer
peltiergekühlten, integrierenden CCD-Videokamera.
BEDO 22 (1989) 279-282
|
208
|
|
C27
|
R. Schwarzer
Röntgen-Rasterapparatur zur Aufnahme von Textur-Verteilungsbildern
mittels energiedispersiver Beugung.
BEDO 22 (1989) 283-288
|
281
|
|
C28
|
R. Schwarzer
Die Ermittlung von Einzelorientierungen und Orientierungskorrelationen
in Al-Sputterschichten.
BEDO 22 (1989) 357-360
|
233
|
|
C29
|
R.A. Schwarzer
Scanning X-ray microscopy for texture mapping by energy dispersive
diffraction.
12th Intern. Congr. X-Ray Optics and Microanalysis, (12th IXCOM),
Cracow 1989, 205-208
|
626
|
|
C30
|
R.A. Schwarzer
Electron diffraction texture analysis.
Proc. 1st Intern. Symposium on Advanced Materials, Islamabad 1989, 65-70
|
714
|
|
C31
|
R. Schwarzer
Elektronenmikroskopische Messung der Kristalltextur in
IC-Metallisierungsschichten.
6. Tagung Festkörperanalytik, Karl-Marx-Stadt 1990, Tagungsband 7/1990
der TU Karl-Marx-Stadt, 70-71
|
83
|
|
C32
|
R. Schwarzer
Abbildende Röntgen-Rasterapparatur mit ED Beugung für Textur- und
RF-Analysen.
6. Tagung Festkörperanalytik, Karl-Marx-Stadt 1990, Tagungsband 7/1990
der TU Karl-Marx-Stadt, 72-73
|
78
|
|
C33
|
R. Schwarzer
Röntgen-Rasterapparatur zur Abbildung von Texturfeldern mittels ED
Beugung und zur RF-Analyse.
Proc. Arbeitskreis Röntgentopographie 1990 (Röto 90), 48-54
|
737
|
|
C34
|
R. Schwarzer
Kristalltextur und Hügelbildung in Dünnschichtmetallisierungen.
Proc. 5th Intern. Conference on Interconnection Technology in
Electronics, Fellbach 1990, 73-76
|
258
|
|
C35
|
R.A. Schwarzer and H. Weiland
Electron microscopy for the determination of preferred crystal
orientations - A concise review.
Proc. 12th Intern. Congr. for Electron Microscopy, Seattle 1990, Vol.
4, 434-435
|
|
|
C36
|
S. Zaefferer and R. Schwarzer
Automatisierte Messung von Einzelorientierungen im TEM.
BEDO 27 (1994) 159-168
|
555
|
|
C37
|
K. Kunze, S. Zaefferer and R.
Schwarzer
Orientierungs-Mapping mit dem Raster-Elektronenmikroskop.
BEDO 27 (1994) 169-176
|
449
|
|
C38
|
R.A. Schwarzer, K. Kunze and S. Zaefferer
The determination of microscale crystal texture.
Proc. 1st Slovene-German Seminar on Joint Projects in Materials Science
and Technology,
Portoroz, 1994, ed. FZ Jülich, ISBN 3-89336-155-3, S. 41-46
|
355
|
|
C39
|
R.A. Schwarzer, F. Springer and
S. Zaefferer
Crystal orientation mapping by digital beam scan and automated
interpretation of backscatter Kikuchi patterns in the SEM.
Proc. 11th Intern. Conf. on Textures of Materials (ICOTOM 11), Xi'an
(China) 1996, 43-52
|
1089
|
|
C40
|
R.A. Schwarzer, N.C. Krieger
Lassen and B. Schäfer
Electron texture goniometer consisting of a TEM with side-entry
goniometer and a CCD camera as an area detector.
Proc. 11th Intern. Conf. on Textures of Materials (ICOTOM 11), Xi'an
(China) 1996, 170-175
|
299
|
|
C41
|
R.A. Schwarzer and M. Wehrhahn
Principles and applications of energy-dispersive x-ray diffraction
texture imaging.
Proc. 11th Intern. Conf. on Textures of Materials (ICOTOM 11), Xi'an
(China) 1996, 176-181
|
1766
|
|
C42
|
F. Wagner, P. Obringer, R.A.
Schwarzer, G. Goaer and D. Sarti
The variation of microstructure in a polycrystalline silicon ingot.
Proc. 11th Intern. Conf. on Textures of Materials (ICOTOM 11), Xi'an
(China) 1996, 1406-1409
|
46
|
|
C43
|
R.A. Schwarzer
Automated crystal orientation mapping (ACOM) of thin metallization
layers and interconnects.
Proc. MRS 1997 Spring Meeting, Symp. I, San Francisco, March 31-April
4, 1997
Materials Research Society Symposium Proceedings Volume 472
(1997) 281-292
|
1149
|
|
C44
|
A.H. Fischer and
R.A. Schwarzer
Ortsaufgelöste Gefüge- und Texturanalyse mit einer
Röntgenrasterapparatur auf der Basis eines Philips X'Pert MRD-Systems.
Tagungsband 9. Philips-Symposium Röntgenbeugung 1998 in Velen, Philips
Kassel 1998, 67-77 (cf. A66)
|
159
|
|
C45
|
R.A. Schwarzer
Orientation stereology by ACOM - A new means to characterize
microstructure.
Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia
Mexicana de Ciencia de Materiales, Cuernavaca 1998, 90
|
18
|
|
C46
|
F. Springer and R.A. Schwarzer
Applications of ACOM on bulk materials and thin films.
Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia
Mexicana de Ciencia de Materiales, Cuernavaca 1998, 90
|
|
C47
|
A. Huot and R.A. Schwarzer
Texture of shear bands in Al-Mg3% (AA5182) and TiAl6V4 measured by BKD.
Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia
Mexicana de Ciencia de Materiales, Cuernavaca 1998, 91
|
|
C48
|
B. Schäfer and R.A. Schwarzer
Measurement of SAD and RHEED pole figures by using a high-grade CCD
camera as an area detector in the TEM.
Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia
Mexicana de Ciencia de Materiales, Cuernavaca 1998, 92
|
|
C49
|
A.H. Fischer and R.A. Schwarzer
Mapping of texture, lattice strain and element distributions with an
X-ray scanning apparatus.
Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia
Mexicana de Ciencia de Materiales, Cuernavaca 1998, 92-93
|
|
C50
|
R.A. Schwarzer
Modern diffraction techniques for the structural analysis of metal
surfaces.
Handbuch Fachrahmenprogramm Geospectra 99, Düsseldorf 1999, 42-43
|
163
|
|
C51
|
R.A. Schwarzer
Development of BKD hardware: Accomplishments and opportunities.
Proc. Microscopy and Microanalysis '99, Oregon 1999. Microscopy and
Microanalysis 5, Suppl. 2, (1999) 242-243
|
12
|
|
C52
|
R.A. Schwarzer
Advancements of ACOM and applications to orientation stereology.
Proc. 12th Intern. Conf. on Textures of Materials (ICOTOM12), Montreal
1999, 52-61
|
366
|
|
C53
|
R.A. Schwarzer and A.H. Fischer
Mapping of lattice strain and texture distributions with an x-ray
scanning apparatus.
Proc. 12th Intern. Conf. on Textures of Materials (ICOTOM 12), Montreal
1999, 204-210
|
231
|
|
C54
|
A. Huot, A.H. Fischer, A. von
Glasow and R.A. Schwarzer
Quantitative texture analysis of Cu damascene interconnects.
In: O. Kraft, E. Arzt, C.A. Volkert, P. Ho and H. Okabayashi (Eds.):
Proc. 5th Intern. Workshop on Stress-Induced Phenomena in
Metallization, MPI Stuttgart 1999. AIP Conference Proceedings 491,
Melville N.Y. 1999, 261-264
|
174
|
|
C55
|
A.H. Fischer, A. von Glasow, A.
Huot and R.A. Schwarzer
Crystal texture of electroplated damascene Cu interconnects.
Proc. Advanced Metallization Conference 1999 (AMC), Orlando
(Florida), Materials Research Society, 1999, 137-141
|
312
|
| C56 |
R.A. Schwarzer, A. Huot and A.H. Fischer
Macro- and microtexture of copper metallization layers measured by ACOM in the SEM.
MRS Spring Meeting, San Francisco, 2000, Abstracts p. 142 |
133 |
|
C57
|
R.A. Schwarzer
The characterization of microstructure by ACOM / EBSD and orientation stereology.
20th
European Crystallographic Meeting (ECM 20) Cracow 2001, Book of Abstracts page 137 |
10
|
|
C58
|
J. Pospiech, R.A. Schwarzer and
K. Wiencek
Komputerowe opracowanie danych z automatycznych pomiar￠dyfrakcyjnych.
(Data elaboration from automatic diffraction measurements. In
Polish language)
KomPlasTech2003, Wisla Jawornik, 2003, 215-222
|
425
|
|
C59
|
J. Pospiech, M. Ostafin and R.A.
Schwarzer
Tekstura i mikrostruktura (i ich
wzajemne relacje) po walcowaniu poprzecznym i diagonalnym.
(in Polish language: Texture and
microstructure (their mutual relation) after cross and oblique rolling. Seminar on the
occasion of Prof. Z. Jasienski’s 70th birthday)
in: Niejednorodności odkształcenia w procesach przeróbki
plastycznej i rekrystalizacji. Seminarium poświecone 70 rocznicy urodzin prof. Z. Jasieńskiego. PAN IMIM Kraków, 21 stycnia 2005, p. 49-59
|
|
|
C60
|
M. Søfferud, J. Hjelen, M.
Karlsen, T. Breivik, N.C. Krieger Lassen and R. Schwarzer
Development of an ultra-fast EBSD detector system.
in: M. Luysberg, K. Tillmann, T. Weirich (Eds.), Proc. 14th European
Microscopy Congress EMC2008 Vol.1: Instrumentation and Methods, Aachen,
1-5 Sept. 2008, Springer Berlin Heidelberg, 2008, ISBN
978-3-540-85154-7
|
45
|
|
C61
|
R. Schwarzer and J. Sukkau
Reproduzierbare EBSD-Messung im REM durch Pattern Streaming und
off-line Auswertung
Vortragstexte der 47. Metallographie-Tagung, Friedrichshafen 2013,
227-232
INVENTUM GmbH, Bonn 2013, ISBN 978-3-88355-398-6
|
197
|
|
Books and various publications
|
|
B1
|
R. Schwarzer
Der Einfluß von Loch- und Ringblenden auf den Bildkontrast und die
Energieverteilung der Elektronen im Emissions- Elektronenmikroskop.
PhD Thesis, University of Tübingen (Germany), 1975
|
|
|
B2
|
R. Schwarzer
Die Bestimmung der lokalen Textur mit dem Elektronenmikroskop.
Habilitation Thesis, Clausthal University of Technology (Germany), 1989
|
|
|
B3
|
R.A. Schwarzer and H. Weiland
Electron diffraction pole figure measurements.
in H.J. Bunge (ed.): Experimental Techniques of Texture Analysis.
DGM-Verlagsgesellschaft, Oberursel and New York 1986, p. 287-300
|
1149
|
|
B4
|
H. Weiland and R. Schwarzer
On-line texture determination by Kikuchi or channeling patterns.
in H.J. Bunge (ed.): Experimental Techniques of Texture Analysis.
DGM-Verlagsgesellschaft, Oberursel and New York 1986, p. 301-313
|
647
|
|
B5
|
R.A. Schwarzer
Crystal texture analysis by means of electron diffraction.
in H.J. Bunge and C. Esling (eds.): Advances and Applications of
Quantitative Texture Analysis. DGM-Verlagsgesellschaft, Oberursel and
New York 1991, p. 51-72
|
1435
|
|
B6
|
R.A. Schwarzer (ed.)
Proceedings International Conference on Texture and Microstructure of
Polycrystals, ITAP-1, Clausthal 22. - 25. September 1997.
Materials Science Forum 273-275 (1998)
ISBN:
0-87849-802-8
|
|
|
B7
|
R.A. Schwarzer
Automated electron backscatter diffraction: Present state and prospects.
In: A. Schwartz, M. Kumar and B.L. Adams (eds.): Electron
Backscatter Diffraction in Materials Science, Kluwer Academic / Plenum
Publishers, 2000, p. 105-122
ISBN:
0-306-46487-X
|
543
|
|
B8
|
R.A. Schwarzer
Modern diffraction techniques for texture analysis.
In R.K. Ray et al. (eds.): Materials for the Third Millenium,
Oxford &IBH Publ. Co., New Delhi 2001, p. 171-195
|
586
|
|
B9
|
C. Esling, M. Humbert, R.A.
Schwarzer and F. Wagner (eds.)
Proceedings 2nd International Conference on Texture and Microstructure
of Polycrystals, ITAP-2, Metz, July 7-9, 2004,
Solid State Phenomena vol. 105 (2005)
ISBN:
3-908451-09-4
|
|
|
B10
|
L. Spieß, R. Schwarzer, H.
Behnken and G. Teichert
Moderne Röntgenbeugung - Röntgendiffraktometrie für
Materialwissenschaftler, Physiker und Chemiker.
Teubner B.G. GmbH Verlag,
2005 ISBN:
3-519-00522-0
|
Chapt.11
2655
|
|
B11
|
R.A. Schwarzer
Texture mapping by scanning X-ray diffraction and related methods.
In: A.K. Singh (ed.): Advanced X-ray Techniques in Research and
Industry.
IOS Press, Amsterdam, The Netherlands, 2005, p. 50-65
ISBN: 1-58603-537-1
Indian edition: Capital Publishing Company, New Delhi, 2006
ISBN: 81-85589-41-0
|
634
|
|
B12
|
D. Rammlmair, M. Wilke, K.
Rickers, R.A. Schwarzer, A. Möller and A. Wittenberg
Methodological Developments and Applications - 7.6 Geology, Mining,
Metallurgy.
in: B. Beckhoff, B. Kanngießer, N. Langhoff, R. Wedell and H. Wolff
(eds.): Handbook of Practical X-Ray Fluorescence Analysis.
Springer-Verlag Berlin Heidelberg 2006,
pp.640-687 ISBN 3-540-28603-9
|
1208
|
|
B13
|
L. Spieß, G.
Teichert, R. Schwarzer, H. Behnken and Ch. Genzel
Moderne Röntgenbeugung - Röntgendiffraktometrie für
Materialwissenschaftler, Physiker und Chemiker. 2nd edition
Vieweg + Teubner, 2009
Paperback ISBN:
978-3-8351-0166-1 |
Chapt.
11&14
3579
|
|
B14
|
H. Klein and R.A. Schwarzer
(eds.)
Proceedings 3rd International Conference on Texture and
Microstructure of Polycrystals, ITAP-3, Göttingen, 23-25 September 2009
Solid State Phenomena vol. 160 (2010) ISBN:
3-908451-78-7 ISBN-13
978-3-908451-78-5
|
|
|
B15
|
R.A. Schwarzer, D.P. Field,
B.L. Adams, M. Kumar and A.J. Schwartz:
Present state of electron backscatter diffraction and prospective
developments.
in: Adam J. Schwartz, Mukul Kumar, Brent L. Adams, David P. Field
(eds.): Electron Backscatter Diffraction in Materials Science, 2nd
edition, Springer Science+Business Media, 2009, pp. 1-20
|
546
|
| B16 |
Hans Joachim Bunge and Robert Arthur
Schwarzer
Crystallographic Texture and Plastic Anisotropy. in: D.
Banabic (ed.): Multiscale Modelling
in Sheet Metal Forming. Springer Intern. Publishing Switzerland 2016,
pp. 47-78 ISBN 978-3-319-44068-2
|
1149 |
