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 Articles published in journals

   
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A1

K.H. Gaukler and R. Schwarzer
Verbessertes Verfahren zur Bestimmung des mittleren inneren Potentials aus Reflexions-Kikuchi-Diagrammen.
Optik 33 (1971) 215-229

424

A2

K.H. Gaukler and R. Schwarzer
Elektronen-Emissions-Mikroskopie (Review article).
Messtechnik 81 (1973) 307-316

1.190

A3

J. Hofmeister and R. Schwarzer
Zum Einfluß der kristallographischen Orientierung auf den vektoriellen Photoeffekt.
Physics Letters 53A (1975) 283-284

501

A4

G.H. Hartmann, H.P. Niemitz and R.A. Schwarzer
Bestimmung des mittleren inneren Potentials von Diamant und von Vanadium-Pentoxid aus Reflexions- Kikuchi- Diagrammen.
Optik 44 (1975) 37-43

488

A5

R. Schwarzer
Der Einfluß von Loch- und Ringblenden auf die Energieverteilung der Elektronen im Emissions-Elektronenmikroskop.
Optik 44 (1975) 61-78

1.078

A6

R. Schwarzer
Die Verbesserung des Bildkontrastes im Emissions-Elektronenmikroskop durch eine ringförmige Aperturblende.
Optik 44 (1975) 121-131

533

A7

M.B. Trullenque, Z.P. Argüello and R.A. Schwarzer
Investigations of ionic crystals with the photoemission electron microscope.
Revista Microscopia Electrónica 3 (1976) 156-157

252

R.A. Schwarzer, J.I. Cisneros, M. Tomyiama, Shih-Lin Chang and Z.P. Argüello

Study of orientation contrast and information depth in LiF with the photoemission electron microscope (PEEM).

A8

W. May, E.A. Farah and R. Schwarzer
EMA and PEEM studies of WC-Ti interface reactions.
Revista Microscopia Electrónica 3 (1976) 190-191

390

A9

R. Schwarzer and K.H. Gaukler
Erzeugung einer Ionen-Mikrosonde mittels Feldionisation und Emissionslinse.
Vakuum-Technik 27 (1978) 2-5

81

A10

R. Schwarzer
Die Bestimmung von Strukturpotentialen aus Kossel-Möllenstedt-Diagrammen an epitaktisch aufgedampften, freitragenden Kupfereinkristallschichten.
Optik 54 (1979) 193-199

 190

A11

R.A. Schwarzer
Emission electron microscopy - A review. Part 1: Basic concepts and applications in physics.
Microscopica Acta 84 (1981) 51-86

1.961

A12

R.A. Schwarzer
Bestimmung von Polfiguren und Texturanalyse mit dem Transmissions-Elektronenmikroskop.
Z. Metallkunde 73 (1982) 495-498

507

A13

R.A. Schwarzer
On-line measurement of foil thickness from Kossel-Möllenstedt diffraction patterns.
Optik 77 (1987) 55-56

 179

A14

R.A. Schwarzer and H. Weiland
Texture analysis by the measurement of individual grain orientations - Electron microscopical methods and application on dual-phase steel.
Textures and Microstructures 8&9 (1988) 551-577

1.459

A15

R.A. Schwarzer
Measurement of local textures with transmission and scanning electron microscopes.
Textures and Microstructures 13 (1990) 15-30

1.502

A16

R. Schwarzer
Die Kristalltextur in der Mikroelektronik.
Teil 1. Elektronenmikroskopische Meßverfahren.
Verbindungstechnik in der Elektronik 3 (1991) Heft 1, 16-20
Teil 2. Hügelbildung in dünnen Metallisierungsschichten.
Verbindungstechnik in der Elektronik 3 (1991) Heft 2, 56-59

1.419

A17

R.A. Schwarzer
A review of the analysis of local texture by electron diffraction.
Textures and Microstructures 14-18 (1991) 85-90

799

A18

R.A. Schwarzer
Scanning X-ray apparatus for texture mapping by energy dispersive diffraction.
Textures and Microstructures 14-18 (1991) 241-244

478

A19

R.A. Schwarzer
Texture analysis by electron diffraction.
Steel Research 62 (1991) 542-547

1.614

A20

D. Gerth, D. Katzer and R. Schwarzer
Correlation between grain growth and hillock growth in thin thermally annealed Al-1%Si films on silicon substrates.
Materials Science Forum 94-96 (1992) 557-562 / Proc. Intern. Conf. on Grain Growth in Polycrystalline Materials, Rome 1991

273

A21

D. Gerth and R.A. Schwarzer
The development of grain-specific texture and grain boundary character during grain growth of Al-1%Si films on SiO2/Si substrates.
Materials Science Forum 113-115 (1993) 619-624 / Proc. Intern. Conf. on Recrystallization and Related Phenomena (Recrystallization '92), San Sebastian 1992

126

A22

D. Gerth and R.A. Schwarzer
The effect of grain-specific texture on hillock growth in Al-1%Si films on SiO2/Si substrates.
Materials Science Forum 113-115 (1993) 625-630 / Proc. Intern. Conf. on Recrystallization and Related Phenomena (Recrystallization '92), San Sebastian 1992

246

A23

S. Zaefferer and R.A. Schwarzer
Microstructure and local texture of partially recrystallized titanium sheet.
Materials Science Forum 113-115 (1993) 721-724 / Proc. Intern. Conf. on Recrystallization and Related Phenomena (Recrystallization '92), San Sebastian 1992

114

A24

R.A. Schwarzer
Crystal texture analysis of ceramics by electron microscopy.
Ceramika 42 (1993) 59-65 / Polski Biuletyn Ceramiczny 4 (1993)

100

A25

R.A. Schwarzer
The determination of local texture by electron diffraction - A tutorial review.
Textures and Microstructures 20 (1993) 7-27

3.495

A26

D. Gerth and R.A. Schwarzer
Graphical representation of grain and hillock orientations in annealed Al-1%Si films.
Textures and Microstructures 21 (1993) 177-193

774

A27

R.A. Schwarzer and D. Gerth
The effect of grain orientation on the relaxation of thermomechanical stress in Al-1%Si conductor layers on SiO2/Si substrates.
Journal of Electronic Materials 22 (1993) 607-610

1.039

A28

R.A. Schwarzer
Texture distributions imaged by energy dispersive x-ray diffraction.
Steel Research 64 (1993) 570-574

1.157

A29

R.A. Schwarzer
A CCD camera system for the acquisition of backscatter Kikuchi patterns on an SEM.
Materials Science Forum 157-162 (1994) 187-188 / Proc. ICOTOM 10, Clausthal 1993

100

A30

R.A. Schwarzer and S. Zaefferer
An inexpensive CCD camera system for recording and on-line interpretation of TEM Kikuchi patterns.
Materials Science Forum 157-162 (1994) 189-194 / Proc. ICOTOM 10, Clausthal 1993

312

A31

R.A. Schwarzer and S. Zaefferer
On-line interpretation of SAD channeling patterns.
Materials Science Forum 157-162 (1994) 195-200 / Proc. ICOTOM 10, Clausthal, 1993

176

A32

R.A. Schwarzer
Preparation of high-resistance or sensitive samples for grain orientation measurements with electron microscopes.
Materials Science Forum 157-162 (1994) 201-206 / Proc. ICOTOM 10, Clausthal 1993

272

A33

S. Zaefferer and R.A. Schwarzer
On-line determination of complete deformation systems for cubic and hexagonal crystals in the TEM.
Materials Science Forum 157-162 (1994) 241-246 / Proc. ICOTOM 10, Clausthal 1993

383

A34

S. Zaefferer and R.A. Schwarzer
On-line interpretation of spot and Kikuchi patterns.
Materials Science Forum 157-162 (1994) 247-250 / Proc. ICOTOM 10, Clausthal 1993

188

A35

W. Xia and R.A. Schwarzer
PC program for the calculation of ODF from SAD pole figures or from individual grain orientations.
Materials Science Forum 157-162 (1994) 487-492 / Proc. ICOTOM 10, Clausthal 1993

300

A36

M. Barthel, D. Gerth, R.A. Schwarzer, P. Klimanek and U. Messerschmidt
Individual grain orientation relations after high-speed hot rolling of steel rods.
Materials Science Forum 157-162 (1994) 1131-1136 / Proc. ICOTOM 10, Clausthal 1993

479

A37

D. Gerth, S. Zaefferer and R.A. Schwarzer
Stress-induced grain growth in thin Al-1% Si films on SiO2/Si substrates.
Materials Science Forum 157-162 (1994) 1205-1210 / Proc. ICOTOM 10, Clausthal 1993

1.304

A38

K. Helming and R.A. Schwarzer
Texture estimate from minimum ranges of SAD pole figures.
Materials Science Forum 157-162 (1994) 1219-1224 / Proc. ICOTOM 10, Clausthal 1993

264

A39

S. Zaefferer, D. Gerth and R.A. Schwarzer
Determination of local texture and deformation systems in TiAl6V4 and T40.
Materials Science Forum 157-162 (1994) 1319-1324 / Proc. ICOTOM 10, Clausthal 1993

523

A40

D. Gerth and R.A. Schwarzer
Local mechanical properties in thin Al layers on Si substrates calculated from measured grain orientations.
Materials Science Forum 157-162 (1994) 1571-1576 / Proc. ICOTOM 10, Clausthal 1993

240

A41

K. Helming, R.A. Schwarzer, B. Rauschenbach, S. Geier, B. Leiss, H.-R.Wenk, K. Ullemeyer and J. Heinitz
Texture estimates by means of components.
Z. Metallkunde 85 (1994) 545-553

1.627

A42

M. Wehrhahn and R.A. Schwarzer
Crystal texture mapping by energy dispersive x-ray diffraction.
Z. Metallkunde 85 (1994) 581-584

321

A43

S. Zaefferer and R.A. Schwarzer
Automated measurement of single grain orientations in the TEM.
Z. Metallkunde 85 (1994) 585-591

403

A44

D. Gerth, D. Katzer and R.A. Schwarzer
The influence of local thermomechanical stress on grain growth in thin Al-1%Si layers on SiO2/Si substrates.
Physica status solidi (a) 146 (1994) 299-316

1.360

A45

R.A. Schwarzer and S. Zaefferer
Automated measurement of grain orientations and on-line determination of complete deformation systems with a TEM.
Advances in X-Ray Analysis 38 (1995) 377-381

235

A46

R.A. Schwarzer and M. Wehrhahn
Scanning x-ray apparatus for crystal texture mapping and micro-fluorescence analysis.
Advances in X-Ray Analysis 38 (1995) 383-385

115

 A47

R.A. Schwarzer, S. Zaefferer and K. Kunze
The characterization of microtexture by orientation mapping.
Advances in X-Ray Analysis 38 (1995) 547-550

144

 A48

K. Helming, B. Rauschenbach and R.A. Schwarzer
Analysis of crystallographic texture in small sample areas.
Textures and Microstructures 26-27 (1996) 111-124

899

 A49

R.A. Schwarzer
The study of crystal texture by electron diffraction on a grain-specific scale.
Microscopy and Analysis 45 (1997) 35-37

 1.574

 A50

R.A. Schwarzer and M. Wehrhahn
X-ray scanning apparatus for mapping texture and element distributions.
Textures and Microstructures 29 (1997) 65-76

918

 A51

R.A. Schwarzer
Advances in crystal orientation mapping with SEM and TEM.
Ultramicroscopy 67 (1997) 19-24

444

 A52

R.A. Schwarzer
Review Paper: Automated crystal lattice orientation mapping using a computer-controlled SEM.
Micron 28 (1997) 249-265

702

 A53

R.A. Schwarzer and J. Sukkau
Automated crystal orientation mapping (ACOM) with a computer-controlled TEM by interpreting transmission Kikuchi patterns.
Materials Science Forum 273-275 (1998) 215-222

731

 A54

B. Schäfer and R.A. Schwarzer
SAD pole figures in transmission and reflection using a high-grade CCD camera as an area detector.
Materials Science Forum 273-275 (1998) 223-228

137

 A55

A.H. Fischer and R.A. Schwarzer
X-ray pole figure measurement and texture mapping of selected areas using an X-ray scanning apparatus.
Materials Science Forum 273-275 (1998) 255-262

547

 A56

A.H. Fischer, D. Weirauch and R.A. Schwarzer
Peltier-cooled solid state drift-chamber detector for energy dispersive X-ray pole-figure measurement and texture mapping.
Materials Science Forum 273-275 (1998) 263-269

670

 A57

A. Huot, R.A. Schwarzer and J.H. Driver
Texture of shear bands in Al-Mg3% (AA5182) measured by BKD.
Materials Science Forum 273-275 (1998) 319-326

493

 A58

A. Ziegenbein, H. Neuhäuser, J. Thesing, R. Ritter, H. Wittich, E. Steck, F. Springer and R.A. Schwarzer
Investigations on local plasticity of CuAl polycrystals by in-situ observations and FEM simulations.
Materials Science Forum 273-275 (1998) 363-368

264

 A59

M. Lepper, A. von Glasow, D. Piscevic and R.A. Schwarzer
Crystal texture and electromigration damage in Al-based interconnect lines studied by ACOM with the SEM.
Materials Science Forum 273-275 (1998) 573-577

193

 A60

A.H. Fischer and R.A. Schwarzer
Mapping of local residual strain with an X-ray scanning apparatus.
Materials Science Forum 273-275 (1998) 673-677 

128

 A61

R.A. Schwarzer
Local crystal textures: experimental techniques and future trends.
Fresenius J. Anal. Chem. 361 (1998) 522-526

451

 A62

R.A. Schwarzer
Crystallography and microstructure of thin films studied by X-ray and electron diffraction.
Materials Science Forum 287-288 (1998) 23-60
Proc. 6th Intern. Symposium on Trends and New Applications of Thin Films, Regensburg 18-20 March 1998

 911

 A63

R.A. Schwarzer
Automated crystal orientation mapping (ACOM) - a new perspective on the characterization of microstructure.
Bulletin Czech and Slovak Crystallographic Association 5 (1998) 35-36
(Special Issue A - ECM-18)

89

 A64

H.J. Bunge and R.A. Schwarzer
Orientierungsstereologie - ein neuer Zweig der Texturforschung.
TU Contact 2 (1998) 67-73

2.093

 A65

S. Kittelberger, U. Bolz, R.P. Huebener, B. Holzapfel, L. Mex and R.A. Schwarzer
Transient local resistivity maximum during temperature dependent oxygen diffusion in YBa2Cu3O7-δ thin films.
Physica C 312 (1999) 7-20

2.887

 A66

R. Schwarzer and A.H. Fischer
Ortsaufgelöste Textur- und Gitterdehnungsanalyse mit einer Röntgenrasterapparatur.
TU Contact 5 (1999) 49-53

1.682

 A67

R.A. Schwarzer and A. Huot
The study of microstructure on a mesoscale by ACOM.
Crystal Research and Technology 35 (2000) 851-862

208

 A68

A.K. Singh and R.A. Schwarzer
Texture and anisotropy of mechanical properties in Titanium and its alloys.
Z. Metallkunde 91 (2000) 702-716

  8.469

 A69

R.A. Schwarzer, A.K. Singh and J. Sukkau
Discrimination and mapping of phase distributions by ACOM.
Materials Science and Technology 16 (2000) 1389-1392

 1.657

 A70

R.A. Schwarzer
Measurement of macro-texture by ACOM - an alternative to XRD.
Materials Science and Technology 16 (2000) 1384-1388

1.556

 A71

H.J. Bunge and R.A. Schwarzer
Orientation stereology - a new branch in texture research.
Advanced Engineering Materials 3 (2001) 25-39

 669

 A72

A.K. Singh and R.A. Schwarzer
Effect of mode of deformation by rolling on the development of texture in binary Ti-Mn alloys.
Scripta Materialia 44 (2001) 375-380

 606

 A73

A.K. Singh and R.A. Schwarzer
Texture of hot rolled and annealed binary Ti-Mn alloys.
Z. Metallkunde 92 (2001) 184-190

  3.929

 A74

A.K. Singh and R.A. Schwarzer
Evolution of cold rolling texture in the binary alloys Ti-0.4Mn and Ti-1.8 Mn.
Materials Science and Engineering A 307 (2001) 151-157

 349

 A75

R.A. Schwarzer
EBSD studies of interconnect lines.
Revue de Métallurgie - SF2M - JA2001 (2001) 65

181

 A76

R.A. Schwarzer
Phase discrimination by automated BKD.
Analytical and Bioanalytical Chemistry (ABC) 374 (2002) 699-702

 301

 A77

R.A. Schwarzer and J. Sukkau
Automated evaluation of Kikuchi patterns by means of Radon and Fast Fourier Transformations, and verification by an Artificial Neural Network.
Advanced Engineering Materials 5 (2003) 601-606

 268

 A78

I.V. Gervas'eva, B.K. Sokolov, R.A. Schwarzer, V.V. Gubernatorov and Ya. V. Podkin
Effect of the initial grain size on the structural inhomogeneity and texture formation upon cold rolling and annealing of the Fe-3% Si alloy.
The Physics of Metals and Metallography 96 Suppl. 1 (2003) S43-S52

 1.044

 A79

R.A. Schwarzer
Automated grain orientation measurement by backscatter Kikuchi diffraction.
The Physics of Metals and Metallography 96 Suppl. 1 (2003) S104-S115

811

 A80

J. Pospiech, M. Ostafin and R.A. Schwarzer
Microstructural aspects of crossrolling of copper.
Inzynieria Matrialowa 24 (2003) 802-805

373

 A81

Z. Jasienski, J. Pospiech, R. Schwarzer, A. Piatkowski and A. Litwora
Inhomogeneity of deformation induced by the change of deformation path in channel-die compressed (112)[11-1] copper single crystals.
Inzynieria Matrialowa 25 (2004) 359-363

 513

 A82

Z. Jasienski, J. Pospiech, A. Piatkowski, R. Schwarzer, A. Litwora and M.Ostafin
Textural and structural effects of the change of deformation path in copper single crystals in a channel-die test.
Archives of Metallurgy and Materials 49 (2004) 11-28

962

 A83

R.A. Schwarzer
Texture in hot extruded, hot rolled and laser welded magnesium base alloys.
Solid State Phenomena 105 (2005) 23-28

 310

 A84

M. Ostafin, J. Pospiech and R.A. Schwarzer
Microstructure and texture in copper sheets after reverse and cross rolling.
Solid State Phenomena 105 (2005) 309-314

 404

 A85

J. Pospiech, Z. Jasienski, M. Ostafin and R.A. Schwarzer
Local and global effects in texture and microstructure observed after channel-die compression of copper single crystals and after cross-rolling of copper sheets.
Solid State Phenomena 105 (2005) 321-326

 252

 A86

R.A. Schwarzer
Deformation textures of fcc metals subjected to frictional and abrasive wear.
Solid State Phenomena 105 (2005) 195-200

 119

A87

A.K. Singh and R.A. Schwarzer
Evolution of texture in pure magnesium during rolling.
Z. Metallkunde 96 (2005) 345- 351

 492

 A88

R.A. Schwarzer
Advances in the analysis of texture and microstructure.
Archives of Metallurgy and Materials 50 (2005) 7-20

 278

 A89

M. Ostafin, J. Pospiech and R.A. Schwarzer
The evolution of deformation texture in copper by unidirectional and by cross rolling.
Archives of Metallurgy and Materials 50 (2005) 403-409

 107

 A90

R.A. Schwarzer
Local texture and back-end defect in hot extruded AZ91 magnesium alloy.
Z. Metallkunde 96 (2005) 1005-1008

 260

 A91

R.A. Schwarzer
Automated crystal orientation measurement by backscatter Kikuchi diffraction.
Z. Kristallographie Suppl. 23 (2006) 163-168 

 108

A92

J. Pospiech, M. Ostafin and R. Schwarzer
The effect of the rolling geometry on the texture and microstructure in AZ31 and copper.
Archives of Metallurgy and Materials 51 (2006) 37-42

483

A93

A.K. Singh and R.A. Schwarzer
Development of cold rolling texture in the binary Ti-0.4Mn alloy.
Metals Materials and Processes 18 (2006) 351-360

 578

A94

B.K. Sokolov, I.V. Gervas'eva, D.P. Rodionov, R.A. Schwarzer and Ya. V. Podkin
Effect of deformation inhomgeneities on the formation of texture during cold rolling and annealing of nickel single crystals.
The Physics of Metals and Metallography 102 (2006) 439-451

 517

 A95

R.A. Schwarzer
The preparation of Mg, Cd and Zn samples for crystal orientation mapping with BKD in an SEM.
Microscopy Today 15 March issue (2007) 40, 42 

 368

 A96

H.-G. Brokmeier, S. Lenser, R. Schwarzer, V. Ventzke, S. Riekehr, M. Kocak and J. Homeyer
Crystallographic texture of dissimilar laser welded Al5083-Al6013 sheets.
Materials Science Forum 539-543 (2007) 3894-3899

 1.767

 A97

A.K. Singh and R.A. Schwarzer
Evolution of texture during thermomechanical processing of Titanium and its alloys.
Trans. Indian Inst. Met. 61 (2008) 371-387

 621

 A98

R.A. Schwarzer
Spatial resolution in ACOM - What will come after EBSD.
Microscopy Today 16 January issue (2008) 5-10

 196

 A99

R.A. Schwarzer
A fast ACOM/EBSD system.
Archives of Metallurgy and Materials 53 (2008) 5-10

 155

 A100

R.A. Schwarzer and J. Hjelen
High-speed orientation microscopy with offline solving sequences of EBSD patterns.
Solid State Phenomena 160 (2010) pp 295-300

 116

 A101

R.A. Schwarzer
Orientation microscopy with Fast EBSD
Materials Science and Technology 26 (2010) 646-649

 107

A102

 J. Sukkau and R.A. Schwarzer
Reconstruction of Kikuchi patterns by intensity-enhanced Radon transformation.
Pattern Recognition Letters 33 (2012) 739-743

 390

A103

R.A. Schwarzer and J. Sukkau
Electron Back Scattered Diffraction: Current state, prospects and comparison with X-ray diffraction texture measurement.
The Banaras Metallurgist 18 (2013) 1-11

219

R. Schwarzer
Orientation microscopy using the analytical scanning electron microscope.
Practical Metallography 51 (2014) 160-179

 
Conference Proceedings
 

 C1

R. Schwarzer, W. Leiser and K.H. Gaukler
Untersuchungen mit dem Photoemissions-Elektronenmikroskop (PhEEM).
BEDO (= Beiträge zur elektronenmikroskop. Direktabbildung von Oberflächen) 5 (1972) 977-986

 400

 C2

G. Möllenstedt and R. Schwarzer
Erste Erfahrungen mit einer Ringblende im Emissions-Elektronenmikroskop Metioskop KE3.
BEDO 6 (1973) 495-506

419

 C3

R. Schwarzer
Zur Abhängigkeit des Kontrastes in einem Emissions-Elektronen-Mikroskop von Art und Größe der Aperturblende.
BEDO 7 (1974) 351-362

 449

 C4

U. Fritz and R. Schwarzer
Erhöhte Bildhelligkeit im Photoemissions-Elektronenmikroskop Metioskop KE3 durch eine neuartige Anodenplatte.
BEDO 9 (1976) 157-166

558

 C5

J. Hofmeister and R. Schwarzer
Der vektorielle Photoeffekt im Photoemissions-Elektronenmikroskop.
BEDO 9 (1976) 167-184 

 1.455

 C6

R. Schwarzer
Transmissions-Kikuchi-Diagramme und Aufnahmen im konvergenten Elektronenbündel an epitaktisch aufgedampften Kupferschichten.
BEDO 10 (1977) 195-202

643

 C7

K. Drescher and R. Schwarzer
Der Kontrast im Photoemission-Elektronenmikroskop bei der Auslösung durch kurz- und langwellige UV-Strahlung.
BEDO 10 (1977) 735-744

1.240

 C8

U. Fritz and R. Schwarzer
Erhöhung des Kontrastes und der Bildhelligkeit im Photoemissions-Elektronenmikroskop durch Gasbelegungen auf Kupfer.
BEDO 10 (1977) 745-764

1.364

 C9

R. Schwarzer and K.H. Gaukler
Long working distance ion gun using a field-ionization source.
Proc.7th Intern. Vacuum Congress & 3rd Intern. Conference on Solid Surfaces, Wien 1977, 2547-2549

 93

 C10

R. Schwarzer, J.I. Cisneros and Z.P. Arguello
Messung der photoelektrischen Ausbeute und der Energieverteilung von Photoelektronen aus LiF-Einkristallen im Photoemissions-Elektronenmikroskop (PEEM).
BEDO 11 (1978) 209-214

 341

 C11

R.A. Schwarzer
Physical aspects of emission electron microscopy.
Proc. 1st EEM Conference, Tübingen 1979 / BEDO 12/2 (1979) 3-38

1.304

 C12

R.A. Schwarzer
Evidence for vectorial photoelectric effect from PEEM study of biological thin sections.
Proc. 1st EEM Conference, Tübingen 1979 / BEDO 12/2 (1979) 165-170

 805

 C13

R.A. Schwarzer
Determination of fibre textures in thin gold films by evaluating pole figures with the TEM.
Proc. 10th Intern. Congress Electron Microscopy, Hamburg 1982, Vol. 2, 129-130

557

 C14

R. Schwarzer
Intensitätskorrektur für die Messung von Polfiguren im TEM.
BEDO 16 (1983) 131-134

 182

 C15

R.A. Schwarzer and H. Weiland
Computer-aided indexing of Kikuchi patterns from cubic, tetragonal, and hexagonal crystals in the determination of grain orientations.
Proc. 8th European Congress on Electron Microscopy (EUREM 1984), Budapest 1984, 341-342

177

 C16

R. Schwarzer and H. Weiland
On-line computerized evaluation of Kikuchi patterns for the determination of preferred orientations and orientation correlations.
Proc. 7th Intern. Conf. on Textures of Materials (ICOTOM 7), Holland 1984, 839-843 

677

 C17

H. Weiland and R. Schwarzer
The determination of preferred orientations with the TEM.
Proc. 7th Intern. Conf. on Textures of Materials (ICOTOM 7), Holland 1984, 857-862

644

 C18

H. Weiland and R. Schwarzer
On-line Auswertung von Kikuchi- und Channelling-Diagrammen.
BEDO 18 (1985) 55-60

645

C19

R. Schwarzer
Polfigurmessung mit einem computergesteuerten Transmissions-Elektronenmikroskop.
BEDO 18 (1985) 61-68

 471

C20

H. Weiland and R. Schwarzer
Automated polefigure measurements and determination of single grain orientations with a computer-controlled TEM.
Proc. 6th Intern. Congress Electron Microscopy, Kyoto 1986, 451

68

 C21

R.A. Schwarzer and H. Weiland
Preferred crystal orientations studied with a computer-controlled transmission electron microscope.
Proc. Intern. Symposium on Electron Optics (ISEOB 86), Institute of Electronics, Academia Sinica, Beijing 1987, 222-224

27

 C22

R.A. Schwarzer and H. Weiland
Measurement of local textures by electron diffraction - Comparison with X-ray texture analysis.
Proc. 8th Intern. Conf. on Textures of Materials (ICOTOM 8), Santa Fe 1987, 203-208

252

 C23

H. Weiland, R.A. Schwarzer and H.J. Bunge
The textures of ferrite and martensite in a dual-phase steel - measured separately by electron diffraction.
Proc. 8th Intern. Conf. on Textures of Materials (ICOTOM 8), Santa Fe 1987, 953-958

229

 C24

R.A. Schwarzer
Quantitative TEM pole-figures of deformed titanium.
Proc. 9th Europ. Congr. Electron Microscopy (EUREM 88), York 1988,
Inst. Physics Conf. Series No. 93 (1988), Vol. 2, 23-24

260

 C25

L.M. Matthews and R.A. Schwarzer
Orientation determination of ferrite and lath martensite in a dual phase steel containing 12% Cr.
Proc. 9th Europ. Congr. Electron Microscopy (EUREM 88), York 1988,
Inst. Physics Conf. Series No. 93 (1988), Vol. 2, 497-498

92

 C26

R. Schwarzer
Die Aufnahme von Reflexions-Kikuchi-Diagrammen im REM mit einer peltiergekühlten, integrierenden CCD-Videokamera.
BEDO 22 (1989) 279-282

 208

 C27

R. Schwarzer
Röntgen-Rasterapparatur zur Aufnahme von Textur-Verteilungsbildern mittels energiedispersiver Beugung.
BEDO 22 (1989) 283-288

281

 C28

R. Schwarzer
Die Ermittlung von Einzelorientierungen und Orientierungskorrelationen in Al-Sputterschichten.
BEDO 22 (1989) 357-360

 233

 C29

R.A. Schwarzer
Scanning X-ray microscopy for texture mapping by energy dispersive diffraction.
12th Intern. Congr. X-Ray Optics and Microanalysis, (12th IXCOM), Cracow 1989, 205-208

626

C30

R.A. Schwarzer
Electron diffraction texture analysis.
Proc. 1st Intern. Symposium on Advanced Materials, Islamabad 1989, 65-70

714

 C31

R. Schwarzer
Elektronenmikroskopische Messung der Kristalltextur in IC-Metallisierungsschichten.
6. Tagung Festkörperanalytik, Karl-Marx-Stadt 1990, Tagungsband 7/1990 der TU Karl-Marx-Stadt, 70-71

83

 C32

R. Schwarzer
Abbildende Röntgen-Rasterapparatur mit ED Beugung für Textur- und RF-Analysen.
6. Tagung Festkörperanalytik, Karl-Marx-Stadt 1990, Tagungsband 7/1990 der TU Karl-Marx-Stadt, 72-73

78

 C33

R. Schwarzer
Röntgen-Rasterapparatur zur Abbildung von Texturfeldern mittels ED Beugung und zur RF-Analyse.
Proc. Arbeitskreis Röntgentopographie 1990 (Röto 90), 48-54

737

 C34

R. Schwarzer
Kristalltextur und Hügelbildung in Dünnschichtmetallisierungen.
Proc. 5th Intern. Conference on Interconnection Technology in Electronics, Fellbach 1990, 73-76

258

 C35

R.A. Schwarzer and H. Weiland
Electron microscopy for the determination of preferred crystal orientations - A concise review.
Proc. 12th Intern. Congr. for Electron Microscopy, Seattle 1990, Vol. 4, 434-435

 C36

S. Zaefferer and R. Schwarzer
Automatisierte Messung von Einzelorientierungen im TEM.
BEDO 27 (1994) 159-168 

 555

 C37

K. Kunze, S. Zaefferer and R. Schwarzer
Orientierungs-Mapping mit dem Raster-Elektronenmikroskop.
BEDO 27 (1994) 169-176

449

 C38

R.A. Schwarzer, K. Kunze and S. Zaefferer
The determination of microscale crystal texture.
Proc. 1st Slovene-German Seminar on Joint Projects in Materials Science and Technology,
Portoroz, 1994, ed. FZ Jülich, ISBN 3-89336-155-3, S. 41-46

355

 C39

R.A. Schwarzer, F. Springer and S. Zaefferer
Crystal orientation mapping by digital beam scan and automated interpretation of backscatter Kikuchi patterns in the SEM.
Proc. 11th Intern. Conf. on Textures of Materials (ICOTOM 11), Xi'an (China) 1996, 43-52 

 1.089

 C40

R.A. Schwarzer, N.C. Krieger Lassen and B. Schäfer
Electron texture goniometer consisting of a TEM with side-entry goniometer and a CCD camera as an area detector.
Proc. 11th Intern. Conf. on Textures of Materials (ICOTOM 11), Xi'an (China) 1996, 170-175

299

 C41

R.A. Schwarzer and M. Wehrhahn
Principles and applications of energy-dispersive x-ray diffraction texture imaging.
Proc. 11th Intern. Conf. on Textures of Materials (ICOTOM 11), Xi'an (China) 1996, 176-181

1.766

 C42

F. Wagner, P. Obringer, R.A. Schwarzer, G. Goaer and D. Sarti
The variation of microstructure in a polycrystalline silicon ingot.
Proc. 11th Intern. Conf. on Textures of Materials (ICOTOM 11), Xi'an (China) 1996, 1406-1409

 46

 C43

R.A. Schwarzer
Automated crystal orientation mapping (ACOM) of thin metallization layers and interconnects.
Proc. MRS 1997 Spring Meeting, Symp. I, San Francisco, March 31-April 4, 1997
Materials Research Society Symposium Proceedings Volume 472 (1997) 281-292

 1.149

 C44

A.H. Fischer and R.A. Schwarzer
Ortsaufgelöste Gefüge- und Texturanalyse mit einer Röntgenrasterapparatur auf der Basis eines Philips X'Pert MRD-Systems.
Tagungsband 9. Philips-Symposium Röntgenbeugung 1998 in Velen, Philips Kassel 1998, 67-77  (cf. A66)

159

 C45

R.A. Schwarzer
Orientation stereology by ACOM - A new means to characterize microstructure.
Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca 1998, 90

18

 C46

F. Springer and R.A. Schwarzer
Applications of ACOM on bulk materials and thin films.
Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca 1998, 90

 C47

A. Huot and R.A. Schwarzer
Texture of shear bands in Al-Mg3% (AA5182) and TiAl6V4 measured by BKD.
Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca 1998, 91

 C48

B. Schäfer and R.A. Schwarzer
Measurement of SAD and RHEED pole figures by using a high-grade CCD camera as an area detector in the TEM.
Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca 1998, 92

 C49

A.H. Fischer and R.A. Schwarzer
Mapping of texture, lattice strain and element distributions with an X-ray scanning apparatus.
Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca 1998, 92-93

 C50

R.A. Schwarzer
Modern diffraction techniques for the structural analysis of metal surfaces.
Handbuch Fachrahmenprogramm Geospectra 99, Düsseldorf 1999, 42-43

163

 C51

R.A. Schwarzer
Development of BKD hardware: Accomplishments and opportunities.
Proc. Microscopy and Microanalysis '99, Oregon 1999. Microscopy and Microanalysis 5, Suppl. 2, (1999) 242-243

12

 C52

R.A. Schwarzer
Advancements of ACOM and applications to orientation stereology.
Proc. 12th Intern. Conf. on Textures of Materials (ICOTOM12), Montreal 1999, 52-61

 366

 C53

R.A. Schwarzer and A.H. Fischer
Mapping of lattice strain and texture distributions with an x-ray scanning apparatus.
Proc. 12th Intern. Conf. on Textures of Materials (ICOTOM 12), Montreal 1999, 204-210

 231

 C54

A. Huot, A.H. Fischer, A. von Glasow and R.A. Schwarzer
Quantitative texture analysis of Cu damascene interconnects.
In: O. Kraft, E. Arzt, C.A. Volkert, P. Ho and H. Okabayashi (Eds.):
Proc. 5th Intern. Workshop on Stress-Induced Phenomena in Metallization, MPI Stuttgart 1999. AIP Conference Proceedings 491, Melville N.Y. 1999, 261-264

 174

 C55

A.H. Fischer, A. von Glasow, A. Huot and R.A. Schwarzer
Crystal texture of electroplated damascene Cu interconnects.
 Proc. Advanced Metallization Conference 1999 (AMC), Orlando (Florida),  Materials Research Society, 1999, 137-141

 312

 C57

 10

 C58

J. Pospiech, R.A. Schwarzer and K. Wiencek
Komputerowe opracowanie danych z automatycznych pomiar￠dyfrakcyjnych. (Data elaboration from automatic diffraction measurements. In Polish language)
KomPlasTech2003, Wisla Jawornik, 2003, 215-222

425

 C59

J. Pospiech, M. Ostafin and R.A. Schwarzer
Tekstura i mikrostruktura (i ich wzajemne relacje) po walcowaniu poprzecznym i diagonalnym.
(in Polish language: Texture and microstructure (their mutual relation) after cross and oblique rolling. Seminar on the occasion of Prof. Z. Jasienski’s 70^th birthday)
in: Niejednorodności odkształcenia w procesach przeróbki plastycznej i rekrystalizacji. Seminarium poświecone 70 rocznicy urodzin prof. Z. Jasieńskiego. PAN IMIM Kraków, 21 stycnia 2005, p. 49-59

 C60

M. Søfferud, J. Hjelen, M. Karlsen, T. Breivik, N.C. Krieger Lassen and R. Schwarzer
Development of an ultra-fast EBSD detector system.
in: M. Luysberg, K. Tillmann, T. Weirich (Eds.), Proc. 14th European Microscopy Congress EMC2008 Vol.1: Instrumentation and Methods, Aachen, 1-5 Sept. 2008, Springer Berlin Heidelberg, 2008,   ISBN 978-3-540-85154-7

 45

 C61

R. Schwarzer and J. Sukkau
Reproduzierbare EBSD-Messung im REM durch Pattern Streaming und off-line Auswertung
Vortragstexte der 47. Metallographie-Tagung, Friedrichshafen 2013, 227-232
INVENTUM GmbH, Bonn 2013,   ISBN 978-3-88355-398-6

 197

Books and various publications
 

 B1

R. Schwarzer
Der Einfluß von Loch- und Ringblenden auf den Bildkontrast und die Energieverteilung der Elektronen im Emissions- Elektronenmikroskop.
PhD Thesis, University of Tübingen (Germany), 1975

 B2

R. Schwarzer
Die Bestimmung der lokalen Textur mit dem Elektronenmikroskop.
Habilitation Thesis, Clausthal University of Technology (Germany), 1989

 B3

R.A. Schwarzer and H. Weiland
Electron diffraction pole figure measurements.
in H.J. Bunge (ed.): Experimental Techniques of Texture Analysis. DGM-Verlagsgesellschaft, Oberursel and New York 1986, p. 287-300

1.149

 B4

H. Weiland and R. Schwarzer
On-line texture determination by Kikuchi or channeling patterns.
in H.J. Bunge (ed.): Experimental Techniques of Texture Analysis. DGM-Verlagsgesellschaft, Oberursel and New York 1986, p. 301-313

647

 B5

R.A. Schwarzer
Crystal texture analysis by means of electron diffraction.
in H.J. Bunge and C. Esling (eds.): Advances and Applications of Quantitative Texture Analysis. DGM-Verlagsgesellschaft, Oberursel and New York 1991, p. 51-72 

1.435

 B6

R.A. Schwarzer (ed.)
Proceedings International Conference on Texture and Microstructure of Polycrystals, ITAP-1, Clausthal 22. - 25. September 1997.   Materials Science Forum 273-275 (1998)              ISBN: 0-87849-802-8

 B7

R.A. Schwarzer
Automated electron backscatter diffraction: Present state and prospects.
In: A. Schwartz, M. Kumar and B.L. Adams (eds.): Electron Backscatter Diffraction in Materials Science, Kluwer Academic / Plenum Publishers, 2000, p. 105-122             ISBN: 0-306-46487-X

 543

 B8

R.A. Schwarzer
Modern diffraction techniques for texture analysis.
In R.K. Ray et al. (eds.): Materials for the Third Millenium,  Oxford &IBH Publ. Co., New Delhi 2001, p. 171-195

 586

 B9

C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner (eds.)
Proceedings 2nd International Conference on Texture and Microstructure of Polycrystals, ITAP-2, Metz, July 7-9, 2004,
Solid State Phenomena vol. 105 (2005)           ISBN: 3-908451-09-4

 B10

L. Spieß, R. Schwarzer, H. Behnken and G. Teichert
Moderne Röntgenbeugung - Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker.
Teubner B.G. GmbH Verlag, 2005          ISBN: 3-519-00522-0

Chapt.11
2.655

 B11

R.A. Schwarzer
Texture mapping by scanning X-ray diffraction and related methods.
In: A.K. Singh (ed.): Advanced X-ray Techniques in Research and Industry.
IOS Press, Amsterdam, The Netherlands, 2005, p. 50-65     ISBN: 1-58603-537-1
Indian edition: Capital Publishing Company, New Delhi, 2006     ISBN: 81-85589-41-0 

 634

 B12

D. Rammlmair, M. Wilke, K. Rickers, R.A. Schwarzer, A. Möller and A. Wittenberg
Methodological Developments and Applications - 7.6 Geology, Mining, Metallurgy.
in: B. Beckhoff, B. Kanngießer, N. Langhoff, R. Wedell and H. Wolff (eds.): Handbook of Practical X-Ray Fluorescence Analysis.
Springer-Verlag Berlin Heidelberg 2006, pp.640-687       ISBN 3-540-28603-9

 1.208

B13

Chapt.
11&14
3.579

B14

H. Klein and R.A. Schwarzer (eds.)
Proceedings 3^rd International Conference on Texture and Microstructure of Polycrystals, ITAP-3, Göttingen, 23-25 September 2009
Solid State Phenomena vol. 160 (2010)    ISBN: 3-908451-78-7       ISBN-13 978-3-908451-78-5

B15

R.A. Schwarzer, D.P. Field, B.L. Adams, M. Kumar and A.J. Schwartz:
Present state of electron backscatter diffraction and prospective developments.
in: Adam J. Schwartz, Mukul Kumar, Brent L. Adams, David P. Field (eds.): Electron Backscatter Diffraction in Materials Science, 2nd edition, Springer Science+Business Media, 2009, pp. 1-20

546

Hans Joachim Bunge and Robert Arthur Schwarzer
Crystallographic Texture and Plastic Anisotropy. in: D. Banabic (ed.): Multiscale Modelling in Sheet Metal Forming. Springer Intern. Publishing Switzerland 2016, pp. 47-78       ISBN 978-3-319-44068-2